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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 10 — May. 12, 2008
  • pp: 7060–7070

Holistic characterization of complex transmittances generated by infrared sub-wavelength gratings

Bruno Toulon, Grégory Vincent, Riad Haïdar, Nicolas Guérineau, Stéphane Collin, Jean-Luc Pelouard, and Jérôme Primot  »View Author Affiliations

Optics Express, Vol. 16, Issue 10, pp. 7060-7070 (2008)

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We present a characterization technique of wide-area sub-wavelength structures. The optical bench is based on lateral shearing interferometry, which allows an accurate complex transmittance (phase and amplitude) measurement. The experimental validation is made in the long-wavelength infrared domain; more precisely we work in the integrated 8–9 µm spectral range. Measurements of the transmitted amplitude and phase shift reveal a good agreement with respectively experimental results based on Fourier Transform infrared spectrometry, and theoretical simulations.

© 2008 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(260.3060) Physical optics : Infrared
(260.2065) Physical optics : Effective medium theory
(160.4236) Materials : Nanomaterials

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: March 10, 2008
Revised Manuscript: April 2, 2008
Manuscript Accepted: April 7, 2008
Published: May 1, 2008

Bruno Toulon, Grégory Vincent, Riad Haidar, Nicolas Guérineau, Stéphane Collin, Jean-Luc Pelouard, and Jérôme Primot, "Holistic characterization of complex transmittances generated by infrared sub-wavelength gratings," Opt. Express 16, 7060-7070 (2008)

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