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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 10 — May. 12, 2008
  • pp: 7382–7396

Material thickness optimization for transmission-mode terahertz time-domain spectroscopy

Withawat Withayachumnankul, Bernd M. Fischer, and Derek Abbott  »View Author Affiliations


Optics Express, Vol. 16, Issue 10, pp. 7382-7396 (2008)
http://dx.doi.org/10.1364/OE.16.007382


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Abstract

The thickness of a sample material for a transmission-mode terahertz time-domain spectroscopy (THz-TDS) measurement is the subject of interest in this paper. A sample that is too thick or too thin can raise the problem of measurement uncertainty. Although greater thickness allows the terahertz radiation—or T-rays—to interact more with bulk material, the SNR rolls off with thickness due to signal attenuation. A sample that is too thin renders itself nearly invisible to T-rays, in such a way that the system can hardly sense the difference between the sample and a free space path. The optimal trade-off is analyzed and revealed in this paper, where our approach is to find the optimal thickness that results in the minimal uncertainty of measured optical constants. The derived model for optimal thickness is supported by the results from experiments performed with polyvinyl chloride (PVC), high-density polyethylene (HDPE), and lactose samples.

© 2008 Optical Society of America

OCIS Codes
(000.2170) General : Equipment and techniques
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(300.1030) Spectroscopy : Absorption
(080.1753) Geometric optics : Computation methods
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:
Spectroscopy

History
Original Manuscript: March 20, 2008
Revised Manuscript: April 30, 2008
Manuscript Accepted: May 1, 2008
Published: May 6, 2008

Virtual Issues
Vol. 3, Iss. 6 Virtual Journal for Biomedical Optics

Citation
Withawat Withayachumnankul, Bernd M. Fischer, and Derek Abbott, "Material thickness optimization for transmission-mode terahertz time-domain spectroscopy," Opt. Express 16, 7382-7396 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-10-7382


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