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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 10 — May. 12, 2008
  • pp: 7407–7417

Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures

A. J. L. Adam, J. M. Brok, M. A. Seo, K. J. Ahn, D. S. Kim, J. H. Kang, Q. H. Park, M. Nagel, and P. C. M. Planken  »View Author Affiliations


Optics Express, Vol. 16, Issue 10, pp. 7407-7417 (2008)
http://dx.doi.org/10.1364/OE.16.007407


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Abstract

Using terahertz-light excitation, we have measured with sub-wavelength spatial, and sub-cycle temporal resolution the time- and frequency-dependent electric-field and surface-charge density in the vicinity of small metallic holes. In addition to a singularity like concentration of the electric field near the hole edges, we observe, that holes can act as differential operators whose near-field output is the time-derivative of the incident electric field. Our results confirm the well-known predictions made by Bouwkamp, Philips Res. Rep. 5, 321–332 (1950), and reveal, with unprecedented detail, what physically happens when light passes through a small hole.

© 2008 Optical Society of America

OCIS Codes
(050.1220) Diffraction and gratings : Apertures
(180.4243) Microscopy : Near-field microscopy
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:
Diffraction and Gratings

History
Original Manuscript: April 1, 2008
Revised Manuscript: April 25, 2008
Manuscript Accepted: April 25, 2008
Published: May 6, 2008

Citation
A. J. L. Adam, J. M. Brok, M. A. Seo, K. J. Ahn, D. S. Kim, J. H. Kang, Q. H. Park, M. Nagel, and P. C.M. Planken, "Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures," Opt. Express 16, 7407-7417 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-10-7407


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