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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 11 — May. 26, 2008
  • pp: 7976–7984

Near-field Raman imaging using optically trapped dielectric microsphere

Johnson Kasim, Yu Ting, You Y. Meng, Liu J. Ping, Alex See, Li L. Jong, and Shen Z. Xiang  »View Author Affiliations


Optics Express, Vol. 16, Issue 11, pp. 7976-7984 (2008)
http://dx.doi.org/10.1364/OE.16.007976


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Abstract

The stumbling block of employing Raman imaging in nanoscience and nanotechnology is the diffraction-limited spatial resolution. Several approaches have been employed to improve the spatial resolution, among which aperture and apertureless near-field Raman techniques are the most frequently used. In this letter, we report a new approach in doing near-field Raman imaging with spatial resolution of about 80 nm, by trapping and scanning a polystyrene microsphere over the sample surface in water. We have used this technique to resolve PMOS transistors with SiGe source drain stressors with poly-Si gates, as well as gold nanopatterns with excellent reproducibility.

© 2008 Optical Society of America

OCIS Codes
(170.5660) Medical optics and biotechnology : Raman spectroscopy
(170.5810) Medical optics and biotechnology : Scanning microscopy
(350.4855) Other areas of optics : Optical tweezers or optical manipulation

ToC Category:
Optical Trapping and Manipulation

History
Original Manuscript: January 29, 2008
Revised Manuscript: March 2, 2008
Manuscript Accepted: March 25, 2008
Published: May 19, 2008

Virtual Issues
Vol. 3, Iss. 6 Virtual Journal for Biomedical Optics

Citation
Johnson Kasim, Yu Ting, You Y. Meng, Liu J. Ping, Alex See, Li L. Jong, and Shen Z. Xiang, "Near-field Raman imaging using optically trapped dielectric microsphere," Opt. Express 16, 7976-7984 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-11-7976


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