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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 11 — May. 26, 2008
  • pp: 8054–8054

Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum

A. J. L. Adam, J. M. Brok, M. A. Seo, K. J. Ahn, D. S. Kim, J. H. Kang, Q. H. Park, M. Nagel, and P. C. M. Planken  »View Author Affiliations


Optics Express, Vol. 16, Issue 11, pp. 8054-8054 (2008)
http://dx.doi.org/10.1364/OE.16.008054


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Abstract

An erratum is presented to correct an error in the discussion section of [Opt. Express. 16, 7407–7417 (2008)] and to add a relevant reference on earlier work.

© 2008 Optical Society of America

OCIS Codes
(050.1220) Diffraction and gratings : Apertures
(180.4243) Microscopy : Near-field microscopy
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:
Diffraction and Gratings

History
Original Manuscript: May 16, 2008
Published: May 19, 2008

Citation
Aurele Adam, Janne Brok, Min Ah Seo, Kwang Jun Ahn, Dai Sik Kim, Ji-Hun Kang, Q-Han Park, M. Nagel, and Paul C. M. Nagel, "Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum," Opt. Express 16, 8054-8054 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-11-8054


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References

  1. A. J. L. Adam, J. M. Brok, M. A. Seo, K. J. Ahn, D. S. Kim, J. H. Kang, Q. H. Park, M. Nagel, and P. C. M. Planken, "Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures," Opt. Express 16, 7407-7417 (2008). [CrossRef] [PubMed]
  2. O. Mitrofanov, L. N. Pfeiffer, and K.W. West, "Generation of low-frequency components due to phase-amplitude modulation of sub-cycle far-infrared pulses in the near-field diffraction," Appl. Phys. Lett. 81, 1579-1581 (2002). [CrossRef]

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