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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 12 — Jun. 9, 2008
  • pp: 8780–8791

Quality factor of Si-based photonic crystal L3 nanocavities probed with an internal source

M. El Kurdi, X. Checoury, S. David, T. P. Ngo, N. Zerounian, P. Boucaud, O. Kermarrec, Y. Campidelli, and D. Bensahel  »View Author Affiliations


Optics Express, Vol. 16, Issue 12, pp. 8780-8791 (2008)
http://dx.doi.org/10.1364/OE.16.008780


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Abstract

We have investigated the quality factors of silicon-based photonic crystal nanocavities using the photoluminescence of a single layer of Ge/Si self-assembled islands as an internal source. We focus on membrane-type L3 elongated cavities with or without their lateral edge air holes shifted in position. The photoluminescence measurements are performed at room temperature. We show that the quality factor of the fundamental mode observed at a normalized frequency u=a/λ≃0.25 is strongly dependent on the incident pump power. This dependence is associated with the free-carrier absorption of the photogenerated carriers. The slope of the quality factor vs. incident pump power gives access to the carrier recombination dynamics in these Si-based nanocavities. The measurements indicate that the carrier dynamics is controlled by non-radiative recombination associated with surface recombinations. A surface recombination velocity of 4.8×104cm/s is deduced from the experiments. The spectral red-shift of the cavity modes as a function of incident pump power is correlated to the temperature rise due to thermo-optic effects. The measured temperature rise, which can reach 190 K, is correlated to the value estimated by a thermal analysis.

© 2008 Optical Society of America

OCIS Codes
(230.0230) Optical devices : Optical devices
(230.5298) Optical devices : Photonic crystals

ToC Category:
Photonic Crystals

History
Original Manuscript: September 6, 2007
Revised Manuscript: January 29, 2008
Manuscript Accepted: February 25, 2008
Published: June 2, 2008

Citation
M. El Kurdi, X. Checoury, S. David, T. P. Ngo, N. Zerounian, P. Boucaud, O. Kermarrec, Y. Campidelli, and D. Bensahel, "Quality factor of Si-based photonic crystal L3 nanocavities probed with an internal source," Opt. Express 16, 8780-8791 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-12-8780


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