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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 13 — Jun. 23, 2008
  • pp: 9436–9442

Dual wavelengths monitoring for optical coatings

Fachun Lai, Xiaochun Wu, Binping Zhuang, Qu Yan, and Zhigao Huang  »View Author Affiliations


Optics Express, Vol. 16, Issue 13, pp. 9436-9442 (2008)
http://dx.doi.org/10.1364/OE.16.009436


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Abstract

A new monitoring method based on the use of dual wavelengths monitoring is proposed. Firstly, the sensitivity of each layer in an optical coating for the monitoring wavelength is calculated by admittance equations. Then two appropriate monitoring wavelengths are chosen to make sure that every layer has a sensitive terminal point. The thickness error of the layer can be compensated. For quarter-wave multilayer and nonquarter-wave multilayer optical coatings, the advantage of this new monitoring method has been demonstrated by both the theoretical analyses and experimental results.

© 2008 Optical Society of America

OCIS Codes
(310.1620) Thin films : Interference coatings
(310.1860) Thin films : Deposition and fabrication

ToC Category:
Thin Films

History
Original Manuscript: April 29, 2008
Revised Manuscript: June 4, 2008
Manuscript Accepted: June 5, 2008
Published: June 11, 2008

Citation
Fachun Lai, Xiaochun Wu, Binping Zhuang, Qu Yan, and Zhigao Huang, "Dual wavelengths monitoring for optical coatings," Opt. Express 16, 9436-9442 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-13-9436


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References

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