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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 13 — Jun. 23, 2008
  • pp: 9513–9518

Full mapping of optical noise in photonic devices: an evaluation by near-field scanning microscopy

Jean-Marie Moison, Izo Abram, and Marcel Bensoussan  »View Author Affiliations

Optics Express, Vol. 16, Issue 13, pp. 9513-9518 (2008)

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We demonstrate the possibility of mapping the transverse spatial distribution of optical noise at the output of photonic devices. Maps of local low-frequency noise are obtained by using statistics on multiple-sampling data from near-field scanning optical microscopy (NSOM). On selected laser diodes, the signatures of basic types of transverse mode instabilities (relative phase and amplitude of modes) are unambiguously obtained. On more complex systems, the types of mode instability can be identified and their intensity can be monitored. Such noise mapping opens a new path for analyzing noise origins and for optimizing device design.

© 2008 Optical Society of America

OCIS Codes
(140.2020) Lasers and laser optics : Diode lasers
(270.2500) Quantum optics : Fluctuations, relaxations, and noise

ToC Category:
Lasers and Laser Optics

Original Manuscript: January 22, 2008
Revised Manuscript: March 1, 2008
Manuscript Accepted: March 20, 2008
Published: June 13, 2008

Jean-Marie Moison, Izo Abram, and Marcel Bensoussan, "Full mapping of optical noise in photonic devices: an evaluation by near-field scanning microscopy," Opt. Express 16, 9513-9518 (2008)

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