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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 13 — Jun. 23, 2008
  • pp: 9746–9752

Dual-band planar electric metamaterial in the terahertz regime

Yu Yuan, Christopher Bingham, Talmage Tyler, Sabarni Palit, Thomas H. Hand, Willie J. Padilla, David R. Smith, Nan Marie Jokerst, and Steven A. Cummer  »View Author Affiliations


Optics Express, Vol. 16, Issue 13, pp. 9746-9752 (2008)
http://dx.doi.org/10.1364/OE.16.009746


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Abstract

We present the design, fabrication, and measurement of a dual-band planar metamaterial with two distinct electric resonances at 1.0 and 1.2 THz, as a step towards the development of frequency agile or broadband THz materials and devices. A method of defining the effective thickness of the metamaterial layer is introduced to simplify the material design and characterization. Good agreement between the simulated and measured transmission is obtained for the fabricated sample by treating the sample as multi-layer system, i. e. the effective metamaterial layer plus the rest of the substrate, as well as properly modeling the loss of the substrate. The methods introduced in this paper can be extended to planar metamaterial structures operating in infrared and optical frequency ranges.

© 2008 Optical Society of America

OCIS Codes
(160.1245) Materials : Artificially engineered materials
(160.3918) Materials : Metamaterials

ToC Category:
Metamaterials

History
Original Manuscript: May 8, 2008
Revised Manuscript: June 10, 2008
Manuscript Accepted: June 11, 2008
Published: June 17, 2008

Citation
Yu Yuan, Christopher Bingham, Talmage Tyler, Sabarni Palit, Thomas H. Hand, Willie J. Padilla, David R. Smith, Nan Marie Jokerst, and Steven A. Cummer, "Dual-band planar electric metamaterial in the terahertz regime," Opt. Express 16, 9746-9752 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-13-9746


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