OSA's Digital Library

Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 14 — Jul. 7, 2008
  • pp: 10471–10479

Compact spatial polariscope for light polarization state analysis

Władysław A. Woźniak and Piotr Kurzynowski  »View Author Affiliations


Optics Express, Vol. 16, Issue 14, pp. 10471-10479 (2008)
http://dx.doi.org/10.1364/OE.16.010471


View Full Text Article

Enhanced HTML    Acrobat PDF (1421 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

A new setup established to measure the light polarization state and the birefringent media parameters is proposed. The described setup consists of two pairs of the linear Wollaston compensators and circular compensators which form a set of two spatially modulated elliptical compensators. These compensators could be used separately as a spatial generator of polarization states and as an analyzer. Using them together allows us to establish a polariscopic setup in which the birefringent media parameters could be measured. When analyzing both the light polarization state and the birefringent media parameters the singular points in the output light intensity appear. The coordinates of these points depend linearly on the azimuth and ellipticity angles of the examined light or on the eigenvectors of the birefringent medium, while the measured light maximum value corresponds to the phase shift for the measurements of the birefringent medium parameters. Neither movable parts nor active elements are needed and no complicated analysis of output light should be made to calculate the desired quantities.

© 2008 Optical Society of America

OCIS Codes
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(230.5440) Optical devices : Polarization-selective devices

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: May 9, 2008
Revised Manuscript: June 13, 2008
Manuscript Accepted: June 14, 2008
Published: June 27, 2008

Citation
Wladyslaw A. Wozniak and Piotr Kurzynowski, "Compact spatial polariscope for light polarization state analysis," Opt. Express 16, 10471-10479 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-14-10471


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. D. H. Goldstein, "Mueller matrix dual-rotating retarder polarimeter," Appl. Opt. 31, 6676-6683 (1992). [CrossRef] [PubMed]
  2. J. L. Pezzaniti and R. A. Chipman, "Mueller matrix imaging polarimetry," Opt. Eng. 34, 1558-1568 (1995). [CrossRef]
  3. C. C. Montarou and T. K. Gaylord, "Two-wave-plate compensator for single-point retardation measurement," Appl. Opt. 43, 6580-6595 (2004). [CrossRef]
  4. P. A. Williams, A. H. Rose, and C. M. Wang, "Rotating-polarizer polarimeter for accurate retardance measurement," Appl. Opt. 36, 6466-6472 (1997). [CrossRef]
  5. N. N. Nagib, "Phase retardometer: a proposed device for measuring phase retardance," Appl. Opt. 39, 2078-2080 (2000). [CrossRef]
  6. S. Y. Berezhna, I. V. Berezhnyy, and M. Takashi, "Dynamic photometric imaging polarizer-sample-analyzer polarimeter: instrument for mapping birefringence and optical rotation," J. Opt. Soc. Am. A 18, 666-672 (2001). [CrossRef]
  7. P. Kurzynowski and W. A. Woźniak, "Phase retardation measurement in simple and reverse Senarmont compensators without calibrated quarter wave plates," Optik 113, 51-53 (2002). [CrossRef]
  8. P. Kurzynowski and W.A. Woźniak, "Simple method of the birefringent media properties determination," Opt. Commun. 259, 424-427 (2006). [CrossRef]
  9. L. H. Shyu, C. L. Chen, and D. C. Su, "Method for measuring the retardation of a wave plate," Appl. Opt. 32, 4228-4230(1993). [CrossRef] [PubMed]
  10. J. M. Bueno, "Polarimetry using liquid-crystal variable retarders: theory and calibration," J. Opt. A, Pure Appl. Opt. 2, 216-222 (2000). [CrossRef]
  11. Y. L. Lo and P. F. Hsu, "Birefringence measurements by an electro-optic modulator using a new heterodyne scheme," Opt. Eng. 41, 2764-2767 (2002). [CrossRef]
  12. B. E. Benkelfat, E. H. Horache, Q. Zou, and B. Vinouze, "An electro-optic modulation technique for direct and accurate measurement of birefringence," Opt. Commun. 221, 271-278 (2003). [CrossRef]
  13. B. Laude-Boulesteix, A. de Martino, B. Drevillon, and L. Schwartz, "Mueller polarimetric imaging system with liquid crystals," Appl. Opt. 43, 2824-2832 (2004). [CrossRef] [PubMed]
  14. Y. L. Lo, S. Y. Lee, and J. F. Lin, "Polariscope for simultaneous measurement of the principal axis and the phase retardation by use of two phase-locked extractions," Appl. Opt. 43, 6248-6254 (2004). [CrossRef] [PubMed]
  15. S. Drobczy�?ski and P. Kurzynowski, "Imaging polarimeter for linear birefringence measurements using a liquid crystal modulator," Opt. Eng. 47, 023603 (2008). [CrossRef]
  16. T. Sato, Y. Sasaki, N. Hashimoto, and S. Kawakami, "Novel scheme of ellipsometry utilizing parallel processing with arrayed photonic crystal," Photonics Nanostruct. Fundam. Appl. 2, 149-154 (2004). [CrossRef]
  17. T. Sato, T. Araki, Y. Sasaki, T. Tsuru, T. Tadokoro, and S. Kawakami, "Compact ellipsometer employing a static polarimeter module with arrayed polarizer and wave-plates elements," Appl. Opt. 46, 4963-4967 (2007). [CrossRef] [PubMed]
  18. M. Mujat, E. Baleine, and A. Dogariu, "Interferometric imaging polarimeter," J. Opt. Soc. Am. A 21, 2244-2249 (2004). [CrossRef]
  19. J. F. Lin and Y. L. Lo, "The new circular heterodyne interferometer with electro-optic modulation for measurement of the optical linear birefringence," Opt. Commun. 260, 486-492 (2006). [CrossRef]
  20. Y. L. Lo, C. H. Lai, J. F. Lin, and P. F. Hsu, "Simultaneously absolute measurements in principal angle and phase retardation using new common-path heterodyne interferometer," Appl. Opt. 43, 2013-2022 (2004). [CrossRef] [PubMed]
  21. B. Wang and T. C. Oakberg, "A new instrument for measuring both the magnitude and angle of low level birefringence," Rev. Sci. Instrum. 70, 3847-3854 (1999). [CrossRef]
  22. M. Takeda, H. Ina, and H. Kobayashi, "Fourier transform method of fringe-pattern analysis for computer based topography and interferometry," J. Opt. Soc. Am. 72, 156-159 (1982). [CrossRef]
  23. B. Zuccarello and G. Tripoli, "Photoelastic stress pattern analysis Fourier transform with carrier fringes: influence of quarter wave plate error," Opt. Lasers Eng. 37, 401-416 (2002). [CrossRef]
  24. K. Oka and T. Kaneko, "Compact complete imaging polarimeter using birefringent wedge prisms," Opt. Express 11, 1510-1519 (2003). [CrossRef] [PubMed]
  25. K. Oka and N. Saito, "Snapshot complete imaging polarimeter using Savart plates," Proc. SPIE 6295, 1-7 (2006).
  26. S. Drobczy�?ski, J. M. Bueno, P. Artal, and H. Kasprzak, "Transmission imaging polarimetry for linear birefringent medium using carrier fringe method," Appl. Opt. 45, 5489-5496 (2006). [CrossRef] [PubMed]
  27. C. C. Montarou and T. K. Gaylord, "Analysis and design of modified Wollaston prisms," Appl. Opt. 38, 6604-6616 (1999). [CrossRef]
  28. M. Soskin and M. V. Vasnetov, "Singular Optics," in Progress in Optics, (Elsevier, 2001), Vol. 42 Chap. 4.

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited