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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 14 — Jul. 7, 2008
  • pp: 10736–10749

The binary dissector: phase contrast tomography of two- and three-material objects from few projections

G. R. Myers, T. E. Gureyev, D. M. Paganin, and S. C. Mayo  »View Author Affiliations


Optics Express, Vol. 16, Issue 14, pp. 10736-10749 (2008)
http://dx.doi.org/10.1364/OE.16.010736


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Abstract

In X-ray computed tomography (CT) increased information requirements (e.g. increased resolution) typically lead to a concurrent increase in the required number of viewing angles, scanning time and delivered dose. We demonstrate that using phase-contrast imaging it is possible to “dissect” two- and three-material objects into their component materials, which in combination with binary tomographic techniques allows us to satisfy increased information requirements without taking the usual images at additional viewing angles. This imaging scheme reduces the scanning time and dose delivered to samples by at least an order of magnitude when compared to conventional X-ray CT. The effects of noise on our reconstruction scheme are investigated for simulated data. Finally, a slice through a glass tube filled with silica and water is reconstructed from 18 projection images taken on an X-ray ultra Microscope (XuM).

© 2008 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(100.6950) Image processing : Tomographic image processing
(340.7440) X-ray optics : X-ray imaging
(090.1995) Holography : Digital holography
(110.3200) Imaging systems : Inverse scattering

ToC Category:
Image Processing

History
Original Manuscript: May 28, 2008
Revised Manuscript: June 22, 2008
Manuscript Accepted: June 23, 2008
Published: July 2, 2008

Virtual Issues
Vol. 3, Iss. 8 Virtual Journal for Biomedical Optics

Citation
G. R. Myers, T. E. Gureyev, D. M. Paganin, and S. C. Mayo, "The binary dissector: phase contrast tomography of two- and three-material objects from few projections," Opt. Express 16, 10736-10749 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-14-10736


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