OSA's Digital Library

Optics Express

Optics Express

  • Vol. 16, Iss. 16 — Aug. 4, 2008
  • pp: 11718–11726

Phase sensitive optical near-field mapping using frequency-shifted laser optical feedback interferometry

Sylvain Blaize, Baptiste Bérenguier, Ilan Stéfanon, Aurélien Bruyant, Gilles Lérondel, Pascal Royer, Olivier Hugon, Olivier Jacquin, and Eric Lacot  »View Author Affiliations

Optics Express, Vol. 16, Issue 16, pp. 11718-11726 (2008)

View Full Text Article

Enhanced HTML    Acrobat PDF (1999 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



The use of laser optical feedback Imaging (LOFI) for scattering-type scanning near-field optical microscopy (sSNOM) is proposed and investigated. We implement this sensitive imaging method by combining a sSNOM with optical heterodyne interferometry and the dynamic properties of a B class laser source which is here used both as source and detector. Compared with previous near field optical heterodyne experiments, this detection scheme provides an optical amplification that is several orders of magnitude higher, while keeping a low noise phase-sensitive detection. Successful demonstration of this complex field imaging technique is done on Silicon on Insulator (SOI) optical waveguides revealing phase singularities and directional leakage.

© 2008 Optical Society of America

OCIS Codes
(040.2840) Detectors : Heterodyne
(110.3175) Imaging systems : Interferometric imaging
(180.4243) Microscopy : Near-field microscopy

ToC Category:

Original Manuscript: April 22, 2008
Revised Manuscript: June 21, 2008
Manuscript Accepted: June 25, 2008
Published: July 21, 2008

Virtual Issues
Vol. 3, Iss. 9 Virtual Journal for Biomedical Optics

Sylvain Blaize, Baptiste Bérenguier, Ilan Stéfanon, Aurélien Bruyant, Gilles Lérondel, Pascal Royer, Olivier Hugon, Olivier Jacquin, and Eric Lacot, "Phase sensitive optical near-field mapping using frequency-shifted laser optical feedback interferometry," Opt. Express 16, 11718-11726 (2008)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. L. Novotny, "Chapter 5 The history of near-field optics," Prog. Opt. 50, 137-184 (2008) [CrossRef]
  2. G. Wurtz, R. Bachelot, and P. Royer, "Imaging a GaAlAs laserdiode in operation using apertureless scanning near-field optical microscopy," Eur. Phys. J. Appl. Phys. 5,269-275 (1999). [CrossRef]
  3. R. Hillenbrand, B. Knoll, and F. Keilmann, "Pure optical contrast in scattering-type scanning near-field microscopy," J. Microsc. (Oxford) 202, 77-83 (2000). [CrossRef]
  4. R. Hillenbrand, T. Taubner, and F. Keilmann, "Phonon enhanced light matter interaction at the nanometre scale," Nature 418,159-162 (2002). [CrossRef] [PubMed]
  5. E. J. Sanchez, L. Novotny, and. X. S. Xie, "Near-field fluorescence microscopy based on two-photon excitation with metal tips," Phys. Rev. Lett. 82, 4014-4017 (1999). [CrossRef]
  6. R. Bachelot, G. Lerondel., S. Blaize, S. Aubert, A. Bruyant, and P. Royer, "Probing photonic and optoelectronic structures by apertureless scanning near-field optical microscopy," Microsc. Res. and Technol. 64 (5-6), 441-452 (2004) [CrossRef]
  7. S. Blaize, S. Aubert, A. Bruyant, R. Bachelot, G. Lerondel, P. Royer, J.-E. Broquin, and V. Minier, "Apertureless scanning near-field optical microscopy for ion exchange channel waveguide characterization, J. Microsc.,  209 (3), 155-161 (2003) [CrossRef]
  8. A. Bruyant, I. Stefanon, G. Lerondel, S. Blaize, S. Aubert, R. Bachelot, P. Royer, P. Pirasteh, J. Charrier, and P. Joubert,"Light propagation in a porous silicon waveguide: An optical modes analysis in near-field," Physica Status Solidi (A) Applications and Materials,  202 (8), 1417-1421 (2005) [CrossRef]
  9. R. S. Taylor, K.E. Leopold, M. Wendman, G. Gurley, and V. Elings, "Scanning probe optical microscopy of evanescent fields,�??�??Rev. Sci. Instrum. 69,2981-2987 (1998). [CrossRef]
  10. S. Aubert, A. BruyantS. Blaize, R. Bachelot, G. Lerondel, S. Hudlet, and P. Royer, "Analysis of the interferometric effect of the background light in apertureless scanning near-.eld optical microscopy," J. Opt. Soc. Am. B 20,2117-2124 (2003). [CrossRef]
  11. T. Taubner, R. Hillenbrand, and F. Keilmann, "Performance of visible and mid-infrared scattering-type near-field optical microscopes," J. Microsc. 210, 311-314 (2003) [CrossRef] [PubMed]
  12. A. Bruyant, G. Lerondel, S. Blaize, I. Stefanon, S. Aubert, R. Bachelot, and P. Royer, " Local complex reflectivity in optical waveguides", Phys. Rev. B,  74, 075414-1-075414-16 (2006) [CrossRef]
  13. I. Stefanon, S. Blaize, A Bruyant, S. Aubert, G. Lerondel, R. Bachelot, and P. Royer " Heterodyne detection of guided waves using a scattering-type optical near-field microscope ", Opt. Express 13, 5553-5564 (2005) [CrossRef] [PubMed]
  14. L. Gomez, R. Bachelot, A. Bouhelier, G.P. Wiederrecht, S.-H. Chang, S.K. Gray, F. Hua, S. Jeon, J.-A. Rogers, M.E. Castro, S. Blaize, I. Stefanon, G. Lerondel, and P. Royer, "Apertureless scanning near-field optical microscopy: A comparison between homodyne and heterodyne approaches," J. Opt. Soc. of Am. B 23, 823-833 (2006) [CrossRef]
  15. I. Stefanon, "Microscopie optique de champ proche à sonde diffusante et détection hétérodyne pour l'étude de structures optiques intégrées sur Silicium," PhD thesis, ICD-LNIO-UTT, (2006)
  16. H. Gilles, S. Girard, M. Laroche, and A. Belarouci, "Near-field amplitude and phase measurements using heterodyne optical feedback on solid-state lasers," Opt. Lett. 33, 1-3 (2008) [CrossRef]
  17. E. Lacot, R. Day, and F. Stoeckel, "Coherent laser detection by frequency-shifted optical feedback," Phys. Rev. A 64, 043815 (2001) [CrossRef]
  18. K. Otsuka, "Highly sensitive measurement of Doppler-shift with a microchip solid-state laser," Jpn. J. Appl. Phys. Part 2 31, L1546 (1992). [CrossRef]
  19. S. Okamoto, H. Takeda, and F. Kannari," Ultrahighly sensitive laser-Doppler velocity meter with a diode-pumped Nd:YVO4 microchip laser, " Rev. Sci. Instrum. 66, 3116 (1995). [CrossRef]
  20. E. Lacot, R. Day, and F. Stoeckel, "Laser optical feedback tomography," Opt. Lett. 24,744-746.(1999) [CrossRef]
  21. E. Lacot and O. Hugon, "Phase-sensitive laser detection by frequency-shifted optical feedback," Phys. Rev. A 70, 0538241-0538248. (2004) [CrossRef]
  22. A. Sinno, P., Ruaux, L. Chassagne, S. Top̧u, Y. Alayli, G. Lerondel, S. Blaize, A. Bruyant, and P. Royer, "Enlarged atomic force microscopy scanning scope: Novel sample-holder device with millimeter range," Rev. Sci. Instrum. 78, 095107 (2007) [CrossRef] [PubMed]
  23. O. Jacquin, E. Lacot, C. Felix, and O. Hugon, "Laser optical feedback imaging insensitive to parasitic optical feedback," Appl. Opt. 46, 6779-6782 (2007) [CrossRef] [PubMed]
  24. E. Le Coarer, S. Blaize, P. Benech, I. Stefanon, A. Morand, G. Leìrondel, G. Leblond, P. Kern, J.-M. Fedeli, and P. Royer, "Wavelength-scale stationary-wave integrated Fourier-transform spectrometry," Nature Photonics 1, 473-478 (2007) [CrossRef]
  25. M. L. M. Balistreri, J. P. Korterik, L. Kuipers, and N. F. Van Hulst, "Local observations of phase singularities in optical fields in waveguide structures," Phys. Rev. Lett. 85, 294-297 (2000) [CrossRef] [PubMed]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited