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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 17 — Aug. 18, 2008
  • pp: 12872–12879

Surface inspection by monitoring spectral shifts of localized plasmon resonances

P. Albella, F. Moreno, J. M. Saiz, and F. González  »View Author Affiliations

Optics Express, Vol. 16, Issue 17, pp. 12872-12879 (2008)

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We present a numerical study of the spectral variations of localized surface plasmon resonances (LSPR) in a 3D-probe metallic nanoparticle scanned over an inhomoegeneous dielectric surface. The possibilities for both, index monitoring and lateral resolution at nanoscale level are explored, with special attention paid to the shape of the probe and the profile of the near field underneath.

© 2008 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(300.0300) Spectroscopy : Spectroscopy

ToC Category:

Original Manuscript: June 19, 2008
Revised Manuscript: July 7, 2008
Manuscript Accepted: July 11, 2008
Published: August 8, 2008

Virtual Issues
Vol. 3, Iss. 10 Virtual Journal for Biomedical Optics

P. Albella, F. Moreno, J. M. Saiz, and F. González, "Surface inspection by monitoring spectral shifts of localized plasmon resonances," Opt. Express 16, 12872-12879 (2008)

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