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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 17 — Aug. 18, 2008
  • pp: 13052–13061

Terahertz spectrum analyzer based on a terahertz frequency comb

Shuko Yokoyama, Ryotaro Nakamura, Masaki Nose, Tsutomu Araki, and Takeshi Yasui  »View Author Affiliations

Optics Express, Vol. 16, Issue 17, pp. 13052-13061 (2008)

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Precision frequency measurements of terahertz (THz) waves are required to establish metrology in the THz spectral region. However, frequency measurement techniques in this region are immature. We propose a THz spectrum analyzer to measure the absolute frequency and spectral shape of continuous-wave THz waves. Based on a stable frequency comb generated in a photoconductive antenna, the absolute frequency of a sub-THz test source was determined at a precision of 2.8×10-11. Furthermore, the spectral bandwidth of the THz spectrum analyzer can be extended over 1 THz, as demonstrated by measurement of a THz test source. This spectrum analyzer has the potential to become a powerful tool for THz frequency metrology.

© 2008 Optical Society of America

OCIS Codes
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6320) Spectroscopy : Spectroscopy, high-resolution
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 23, 2008
Revised Manuscript: July 31, 2008
Manuscript Accepted: August 5, 2008
Published: August 11, 2008

Shuko Yokoyama, Ryotaro Nakamura, Masaki Nose, Tsutomu Araki, and Takeshi Yasui, "Terahertz spectrum analyzer based on a terahertz frequency comb," Opt. Express 16, 13052-13061 (2008)

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