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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 18 — Sep. 1, 2008
  • pp: 13663–13675

Measuring the spatiotemporal electric field of tightly focused ultrashort pulses with sub-micron spatial resolution.

Pamela Bowlan, Ulrike Fuchs, Rick Trebino, and Uwe D. Zeitner  »View Author Affiliations

Optics Express, Vol. 16, Issue 18, pp. 13663-13675 (2008)

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We demonstrate a powerful and practical spectral interferometer with near-field scanning microscopy (NSOM) probes for measuring the spatiotemporal electric field of tightly focused ultrashort pulses with high spatial and spectral resolution. Our measurements involved numerical apertures as high as 0.44 and yielded the spatiotemporal field at and around the foci produced by two microscope objectives and several different lenses. For the first time, we measure the spatiotemporal field of the Bessel-like X-shaped pulse caused by spherical aberrations and a “fore-runner pulse” due to chromatic aberrations. We observed spatial features smaller than 1µm and verified these results with non-paraxial simulations.

© 2008 Optical Society of America

OCIS Codes
(220.3630) Optical design and fabrication : Lenses
(260.3160) Physical optics : Interference
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Ultrafast Optics

Original Manuscript: July 11, 2008
Revised Manuscript: August 14, 2008
Manuscript Accepted: August 14, 2008
Published: August 20, 2008

Virtual Issues
Vol. 3, Iss. 11 Virtual Journal for Biomedical Optics

Pamela Bowlan, Ulrike Fuchs, Rick Trebino, and Uwe D. Zeitner, "Measuring the spatiotemporal electric field of tightly focused ultrashort pulses with sub-micron spatial resolution," Opt. Express 16, 13663-13675 (2008)

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