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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 18 — Sep. 1, 2008
  • pp: 14064–14075

Fast, bias-free algorithm for tracking single particles with variable size and shape

Andrew J. Berglund, Matthew D. McMahon, Jabez J. McClelland, and J. Alexander Liddle  »View Author Affiliations

Optics Express, Vol. 16, Issue 18, pp. 14064-14075 (2008)

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We introduce a fast and robust technique for single-particle tracking with nanometer accuracy. We extract the center-of-mass of the image of a single particle with a simple, iterative algorithm that efficiently suppresses background-induced bias in a simplistic centroid estimator. Unlike many commonly used algorithms, our position estimator requires no prior information about the shape or size of the tracked particle image and uses only simple arithmetic operations, making it appropriate for future hardware implementation and real-time feedback applications. We demonstrate it both numerically and experimentally, using an inexpensive CCD camera to localize 190 nm fluorescent microspheres to better than 5 nm.

© 2008 Optical Society of America

OCIS Codes
(100.2960) Image processing : Image analysis
(180.2520) Microscopy : Fluorescence microscopy

ToC Category:
Image Processing

Original Manuscript: May 19, 2008
Revised Manuscript: August 1, 2008
Manuscript Accepted: August 21, 2008
Published: August 26, 2008

Virtual Issues
Vol. 3, Iss. 11 Virtual Journal for Biomedical Optics

Andrew J. Berglund, Matthew D. McMahon, Jabez J. McClelland, and J. A. Liddle, "Fast, bias-free algorithm for tracking single particles with variable size and shape," Opt. Express 16, 14064-14075 (2008)

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