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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 19 — Sep. 15, 2008
  • pp: 14703–14715

Optics InfoBase > Optics Express > Volume 16 > Issue 19 > Page 14703

Third-harmonic generation microscopy with focus-engineered beams: a numerical study

Nicolas Olivier and Emmanuel Beaurepaire  »View Author Affiliations


Optics Express, Vol. 16, Issue 19, pp. 14703-14715 (2008)
http://dx.doi.org/10.1364/OE.16.014703


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Abstract

We use a vector field model to analyze third-harmonic generation (THG) from model geometries (interfaces, slabs, periodic structures) illuminated by Hermite-Gaussian (HG) and Laguerre-Gaussian (LG) beams focused by a high NA lens. Calculations show that phase matching conditions are significantly affected by the tailoring of the field distribution near focus. In the case of an interface parallel to the optical axis illuminated by an odd HG mode, the emission patterns and signal level reflect the relative orientation of the interface and the focal field structure. In the case of slabs and periodic structures, the emission patterns reflect the interplay between focal field distribution (amplitude and phase) and sample structure. Forward-to-backward emission ratios using different beam shapes provide sub-wavelength information about sample spatial frequencies.

© 2008 Optical Society of America

OCIS Codes
(170.3880) Medical optics and biotechnology : Medical and biological imaging
(180.6900) Microscopy : Three-dimensional microscopy
(190.4160) Nonlinear optics : Multiharmonic generation

ToC Category:
Microscopy

History
Original Manuscript: July 8, 2008
Revised Manuscript: August 21, 2008
Manuscript Accepted: August 21, 2008
Published: September 3, 2008

Virtual Issues
Vol. 3, Iss. 11 Virtual Journal for Biomedical Optics

Citation
Nicolas Olivier and Emmanuel Beaurepaire, "Third-harmonic generation microscopy with focus-engineered beams: a numerical study," Opt. Express 16, 14703-14715 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-19-14703


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