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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 2 — Jan. 21, 2008
  • pp: 1132–1141

Theoretical development of a high-resolution differential-interference-contrast optic for x-ray microscopy

Olov von Hofsten, Michael Bertilson, and Ulrich Vogt  »View Author Affiliations

Optics Express, Vol. 16, Issue 2, pp. 1132-1141 (2008)

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In this paper, the theoretical background and development of a differential-interference contrast (DIC) x-ray optic is presented. The single-element optic is capable of high-resolution phase contrast imaging and is compatible with compact sources. It is shown that an understanding of the coherence requirements in this type of imaging is imperative and is explained in detail. The optic is capable of a wavefront separation equal to the resolution of the optic which places only minor constraints on the object illumination.

© 2008 Optical Society of America

OCIS Codes
(050.1970) Diffraction and gratings : Diffractive optics
(180.7460) Microscopy : X-ray microscopy
(340.0340) X-ray optics : X-ray optics

ToC Category:
X-ray Optics

Original Manuscript: November 16, 2007
Revised Manuscript: January 11, 2008
Manuscript Accepted: January 13, 2008
Published: January 15, 2008

Virtual Issues
Vol. 3, Iss. 2 Virtual Journal for Biomedical Optics

Olov von Hofsten, Michael Bertilson, and Ulrich Vogt, "Theoretical development of a high-resolution differential-interference-contrast optic for x-ray microscopy," Opt. Express 16, 1132-1141 (2008)

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