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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 2 — Jan. 21, 2008
  • pp: 1222–1231

Broadband enhanced backscattering spectroscopy of strongly scattering media

O. L. Muskens and A. Lagendijk  »View Author Affiliations

Optics Express, Vol. 16, Issue 2, pp. 1222-1231 (2008)

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We report on a new experimental method for enhanced backscattering spectroscopy (EBS) of strongly scattering media over a bandwidth from 530–1000 nm. The instrument consists of a supercontinuum light source and an angle-dependent detection system using a fiber-coupled grating spectrometer. Using a combination of two setups, the backscattered intensity is obtained over a large angular range and using circularly polarized light. We present broadband EBS of a TiO2 powder and of a strongly scattering porous GaP layer. In combination with theoretical model fits, the EBS system yields the optical transport mean free path over the available spectral window.

© 2008 Optical Society of America

OCIS Codes
(290.4210) Scattering : Multiple scattering
(300.6250) Spectroscopy : Spectroscopy, condensed matter
(160.4236) Materials : Nanomaterials
(350.4238) Other areas of optics : Nanophotonics and photonic crystals

ToC Category:

Original Manuscript: December 12, 2007
Revised Manuscript: January 10, 2008
Manuscript Accepted: January 15, 2008
Published: January 16, 2008

Virtual Issues
Vol. 3, Iss. 2 Virtual Journal for Biomedical Optics

O. L. Muskens and A. Lagendijk, "Broadband enhanced backscattering spectroscopy of strongly scattering media," Opt. Express 16, 1222-1231 (2008)

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