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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 2 — Jan. 21, 2008
  • pp: 740–747

Fourier analysis of surface plasmon waves launched from single nanohole and nanohole arrays: unraveling tip-induced effects

Y. C. Chang, J. Y. Chu, T. J. Wang, M. W. Lin, J. T. Yeh, and J.-K. Wang  »View Author Affiliations

Optics Express, Vol. 16, Issue 2, pp. 740-747 (2008)

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The authors report the investigation of surface plasmon waves (SPW) generated by single nanohole and nanohole arrays. Scattering-type scanning near-field microscopy is used to directly observe near-field distribution. The images after Fourier transformation display characteristic patterns that match with the derived analytic formula. The correspondence helps to identify the role of the scanning tip in generating SPW, making possible of the removal of this tip-induced effect. This study provides a means to perform in-depth investigation on surface plasmon polaritons.

© 2008 Optical Society of America

OCIS Codes
(240.6680) Optics at surfaces : Surface plasmons
(180.4243) Microscopy : Near-field microscopy

ToC Category:
Optics at Surfaces

Original Manuscript: December 3, 2007
Revised Manuscript: January 4, 2008
Manuscript Accepted: January 4, 2008
Published: January 9, 2008

Virtual Issues
Vol. 3, Iss. 2 Virtual Journal for Biomedical Optics

Y. C. Chang, J. Y. Chu, T. J. Wang, M. W. Lin, J. T. Yeh, and J. K. Wang, "Fourier analysis of surface plasmon waves launched from single nanohole and nanohole arrays: unraveling tip-induced effects," Opt. Express 16, 740-747 (2008)

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Fig. 1. Fig. 2. Fig. 3.

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