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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 2 — Jan. 21, 2008
  • pp: 920–926

Optically modulated internal strain in InGaN quantum dots grown on SINx nano masks

H. J. Chang, T. T. Chen, L. L. Huang, Y. F. Chen, J. Y. Tsai, T. C. Wang, and H. C. Kuo  »View Author Affiliations


Optics Express, Vol. 16, Issue 2, pp. 920-926 (2008)
http://dx.doi.org/10.1364/OE.16.000920


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Abstract

Optically modulated internal strain has been observed in InGaN quantum dots (QDs) deposited on SINx nano masks. The modulated internal strain can induce a number of intriguing effects, including the change of refractive index and the redshift of InGaN A1(LO) phonon. The underlying mechanism can be well accounted for in terms of the variation of internal strain through the converse piezoelectric effect arising from the screening of the internal electric field due to spatial separation of photoexcited electrons and holes. Our results point out a convenient way for the fine tuning of physical properties in nitride-based semiconductor nanostructures, which is very important for high quality optoelectronic devices.

© 2008 Optical Society of America

OCIS Codes
(250.5230) Optoelectronics : Photoluminescence
(300.6450) Spectroscopy : Spectroscopy, Raman

ToC Category:
Optoelectronics

History
Original Manuscript: July 9, 2007
Revised Manuscript: August 16, 2007
Manuscript Accepted: September 28, 2007
Published: January 10, 2008

Citation
H. J. Chang, T. T. Chen, L. L. Huang, Y. F. Chen, J. Y. Tsai, T. C. Wang, and H. C. Kuo, "Optically modulated internal strain in InGaN quantum dots grown on SiNx nano masks," Opt. Express 16, 920-926 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-2-920


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