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Optics Express

Optics Express

  • Editor: Martijn de Sterke
  • Vol. 16, Iss. 20 — Sep. 29, 2008
  • pp: 16138–16150

An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 2. Interpretation and application to focusing experiments

Ch Morawe, J-P. Guigay, V. Mocella, and C. Ferrero  »View Author Affiliations


Optics Express, Vol. 16, Issue 20, pp. 16138-16150 (2008)
http://dx.doi.org/10.1364/OE.16.016138


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Abstract

Aberration effects are studied in parabolic and elliptic multilayer mirrors for hard x-rays, basing on a simple analytical approach. The interpretation of the underlying equations provides insight into fundamental limitations of the focusing properties of curved multilayers. Using realistic values for the multilayer parameters the potential impact on the broadening of the focal spot is evaluated. Within the limits of this model, systematic contributions to the spot size can be described. The work is complemented by a comparison with experimental results obtained with a W/B4C curved multilayer mirror.

© 2008 Optical Society of America

OCIS Codes
(080.1010) Geometric optics : Aberrations (global)
(080.2720) Geometric optics : Mathematical methods (general)
(340.6720) X-ray optics : Synchrotron radiation
(340.7470) X-ray optics : X-ray mirrors
(080.4228) Geometric optics : Nonspherical mirror surfaces

ToC Category:
X-ray Optics

History
Original Manuscript: June 11, 2008
Revised Manuscript: August 5, 2008
Manuscript Accepted: August 14, 2008
Published: September 26, 2008

Citation
Ch. Morawe, J.-P. Guigay, V. Mocella, and C. Ferrero, "An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 2. Interpretation and application to focusing experiments," Opt. Express 16, 16138-16150 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-20-16138


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References

  1. J-P. Guigay, Ch. Morawe, V. Mocella, and C. Ferrero, "An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 1. Derivation of caustic shapes," Opt. Express 16, 12050-12059 (2008) and references therein. [CrossRef] [PubMed]
  2. H. Mimura, S. Matsuyama, H. Yumoto, S. Handa, T. Kimura, Y. Sano, K. Tamasaku, Y. Nishino, M. Yabashi, T. Ishikawa, and K. Yamauchi, "Reflective optics for sub-10nm hard X-ray focusing," Proc. SPIE 6705, 67050L (2007). [CrossRef]
  3. H. Mimura, S. Handa, and K. Yamauchi, Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, Japan (personal communication, 2008)
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  5. Ch. Morawe, O. Hignette, P. Cloetens, W. Ludwig, Ch. Borel, P. Bernard, and A. Rommeveaux, "Graded multilayers for focusing hard x rays below 50 nm," Proc. SPIE 6317, 63170F (2006). [CrossRef]
  6. M. Schuster and H. Göbel, "Parallel beam coupling into channel-cut monochromators using curved graded multilayers," J. Phys. D: Appl. Phys. 28, A270 (1995). [CrossRef]
  7. Ch. Morawe, P. Pecci, J-Ch. Peffen, and E. Ziegler, "Design and performance of graded multilayers as focusing elements for x-ray optics," Rev. Sci. Instrum. 70, 3227 (1999). [CrossRef]

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