Localization of a fluorescent source without numerical fitting
Optics Express, Vol. 16, Issue 23, pp. 18714-18724 doi:10.1364/OE.16.018714
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- OCIS Codes:
- (100.2960) Image processing : Image analysis
- (180.2520) Microscopy : Fluorescence microscopy
- (300.6280) Spectroscopy : Spectroscopy, fluorescence and luminescence
Microscopy
Citation
Sean Andersson, "Localization of a fluorescent source without numerical fitting," Opt. Express 16, 18714-18724 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-23-18714
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Abstract
We present an algebraic solution to the problem of localizing a single fluorescent particle with sub-diffraction-limit accuracy. The algorithm is derived and its performance studied experimentally. Isolated 20 nm fluorescent beads were imaged using a wide-field microscope at two different positions separated by 100 nm and at a range of signal-to-noise ratios (SNR). The data were analyzed using both the new algorithm and the standard approach of fitting the data to a Gaussian profile. Results indicate that the proposed approach is nearly as accurate as Gaussian fitting across a wide range of SNR while executing over 200 times faster. In addition, the new algorithm is able to localize at lower SNR than the fitting method.
© 2008 Optical Society of America
» View Full Text: Acrobat PDF (289 KB)
History
Original Manuscript: August 29, 2008
Manuscript Accepted: October 24, 2008
Revised Manuscript: October 9, 2008
Published: October 29, 2008
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Author Affiliations
Boston University
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