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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 23 — Nov. 10, 2008
  • pp: 19304–19309

Enhanced antireflecting properties of microstructured top-flat pyramids

R. Bouffaron, L. Escoubas, J. J. Simon, Ph. Torchio, F. Flory, G. Berginc, and Ph. Masclet  »View Author Affiliations

Optics Express, Vol. 16, Issue 23, pp. 19304-19309 (2008)

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This paper aims at modeling bi-periodic micro-structured silicon surfaces exhibiting broadband antireflection properties in the infrared range using Rigorous Coupled-Wave Analysis (RCWA). These structures of pyramidal shape, which typical dimensions are smaller than the wavelength, are not in the Effective Medium Theory (EMT) validity domain. The influence of various opto-geometrical parameters such as period, depth, shape of the pattern is examined. The antireflective properties of such biperiodic patterned surfaces are then discussed using the photonic crystal theory and photonic band diagrams description. Correlations between the density of Bloch modes, their localizations with respect to the incident medium light line and the surface reflectance are presented.

© 2008 Optical Society of America

OCIS Codes
(310.1210) Thin films : Antireflection coatings
(050.5298) Diffraction and gratings : Photonic crystals
(050.5745) Diffraction and gratings : Resonance domain
(050.6624) Diffraction and gratings : Subwavelength structures

ToC Category:
Diffraction and Gratings

Original Manuscript: June 18, 2008
Revised Manuscript: July 17, 2008
Manuscript Accepted: July 17, 2008
Published: November 7, 2008

R. Bouffaron, L. Escoubas, J. J. Simon, Ph. Torchio, F. Flory, G. Berginc, and Ph. Masclet, "Enhanced antireflecting properties of micro-structured top-flat pyramids," Opt. Express 16, 19304-19309 (2008)

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