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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 24 — Nov. 24, 2008
  • pp: 19686–19694

Broadband super-resolution imaging by a superlens with unmatched dielectric medium

Xuefeng Yang, Yao Liu, Junxian Ma, Jianhua Cui, Hui Xing, Wei Wang, Changtao Wang, and Xiangang Luo  »View Author Affiliations


Optics Express, Vol. 16, Issue 24, pp. 19686-19694 (2008)
http://dx.doi.org/10.1364/OE.16.019686


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Abstract

It is shown that a superlens with unmatched dielectric medium (termed as “unmatched superlens”, UMSL) can enable super-resolution imaging in a broad frequency range. The broadband UMSL comprises dielectric-metal-dielectric layers with appropriately designed thickness. Numerical simulations demonstrate that the deficiency of imaging due to the mismatched permittivity of the metal and dielectric can be improved with the existence of two waveguide modes of the UMSL structure. The frequency band and quality of super resolution imaging are mainly determined by the two modes, which deliver the amplitude and phase modulation of transmitted evanescent waves in a wide transversal wave-number range.

© 2008 Optical Society of America

OCIS Codes
(260.3910) Physical optics : Metal optics
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Imaging Systems

History
Original Manuscript: October 6, 2008
Revised Manuscript: November 2, 2008
Manuscript Accepted: November 11, 2008
Published: November 13, 2008

Citation
Xuefeng Yang, Yao Liu, Junxian Ma, Jianhua Cui, Hui Xing, Wei Wang, Changtao Wang, and Xiangang Luo, "Broadband super-resolution imaging by a superlens with unmatched dielectric medium," Opt. Express 16, 19686-19694 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-24-19686


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