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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 24 — Nov. 24, 2008
  • pp: 19950–19956

Phase Imaging Using A Polychromatic X-ray Laboratory Source

B.D. Arhatari, K. Hannah, E. Balaur, and A.G. Peele  »View Author Affiliations


Optics Express, Vol. 16, Issue 24, pp. 19950-19956 (2008)
http://dx.doi.org/10.1364/OE.16.019950


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Abstract

We describe a quantitative phase imaging process using an x-ray laboratory-based source with an extremely broad bandwidth spectrum. The thickness of a homogeneous object can be retrieved by using separately spectrally weighted values for the attenuation coefficient and the decrement of the real part of the refractive index. This method is valid for a wide range of object types, including objects with an absorption edge in the used energy range. The accessibility of conventional x-ray laboratory sources makes this method very useful for quantitative phase retrieval of homogeneous objects. We demonstrate the application of this method for quantitative phase retrieval imaging in tomographic measurements.

© 2008 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(340.0340) X-ray optics : X-ray optics
(340.7440) X-ray optics : X-ray imaging

ToC Category:
X-ray Optics

History
Original Manuscript: October 10, 2008
Revised Manuscript: November 2, 2008
Manuscript Accepted: November 12, 2008
Published: November 19, 2008

Citation
B. D. Arhatari, K. Hannah, E. Balaur, and A. G. Peele, "Phase imaging using a polychromatic x-ray laboratory source," Opt. Express 16, 19950-19956 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-24-19950


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References

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