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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 24 — Nov. 24, 2008
  • pp: 20029–20037

Femtosecond laser modification of fused silica: the effect of writing polarization on Si-O ring structure

Douglas J. Little, Martin Ams, Peter Dekker, Graham D. Marshall, Judith M. Dawes, and Michael J. Withford  »View Author Affiliations


Optics Express, Vol. 16, Issue 24, pp. 20029-20037 (2008)
http://dx.doi.org/10.1364/OE.16.020029


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Abstract

A femtosecond laser with a 1 kHz repetition rate and two different polarization states was used to fabricate low-loss waveguides in fused silica. Investigations of chemically-mechanically polished waveguide regions using near-field scanning optical microscopy revealed the presence of modifications outside the glass regions directly exposed to a circularly polarized writing laser. These waveguides also exhibited refractive index contrast up to twice as large as that of waveguides written with linearly polarized radiation. The observed differences in refractive index were shown by Raman spectroscopy to correlate to an increased concentration of 3-member silicon-oxygen ring structures. We propose that the observed differences in material properties are due to the polarization dependence of photo-ionization rates in fused silica.

© 2008 Optical Society of America

OCIS Codes
(160.2750) Materials : Glass and other amorphous materials
(190.4180) Nonlinear optics : Multiphoton processes
(230.7370) Optical devices : Waveguides
(320.2250) Ultrafast optics : Femtosecond phenomena
(350.3390) Other areas of optics : Laser materials processing

ToC Category:
Ultrafast Optics

History
Original Manuscript: September 26, 2008
Revised Manuscript: November 6, 2008
Manuscript Accepted: November 6, 2008
Published: November 20, 2008

Citation
Douglas J. Little, Martin Ams, Peter Dekker, Graham D. Marshall, Judith M. Dawes, and Michael J. Withford, "Femtosecond laser modification of fused silica: the effect of writing polarization on Si-O ring structure," Opt. Express 16, 20029-20037 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-24-20029


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