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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 24 — Nov. 24, 2008
  • pp: 20117–20125

Surface-enhanced Raman scattering at a planar dielectric interface beyond critical angle

Denis Pristinski, Eric C. Le Ru, Siliu Tan, Svetlana Sukhishvili, and Henry Du  »View Author Affiliations

Optics Express, Vol. 16, Issue 24, pp. 20117-20125 (2008)

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Light refraction at the planar boundary of dielectric media prevents light propagation in the higher refractive index medium at angles beyond the critical value. This limitation is lifted when the evanescent wave is excited at the lower refractive index side of the interface. In this work we quantify polarization and angle dependence of surface-enhanced Raman scattering (SERS) intensity beyond the critical angle. Specifically, Raman spectra of thiocyanate molecules adsorbed on clustered silver nanoparticles at the water-glass interface were acquired using evanescent excitation and detection. Detected SERS signal polarization and scattering angle dependence are shown to be in agreement with a simple model based on excitation and radiation of a classical dipole near a lossless interface.

© 2008 Optical Society of America

OCIS Codes
(240.6490) Optics at surfaces : Spectroscopy, surface
(260.6970) Physical optics : Total internal reflection
(240.6695) Optics at surfaces : Surface-enhanced Raman scattering

ToC Category:
Optics at Surfaces

Original Manuscript: September 26, 2008
Revised Manuscript: November 11, 2008
Manuscript Accepted: November 12, 2008
Published: November 21, 2008

Denis Pristinski, Eric C. Le Ru, Siliu Tan, Svetlana Sukhishvili, and Henry Du, "Surface-enhanced Raman scattering at a planar dielectric interface beyond critical angle," Opt. Express 16, 20117-20125 (2008)

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