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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 25 — Dec. 8, 2008
  • pp: 20516–20521

Critical sensitivity in hetero-modal interferometric sensor using spectral interrogation

Ronen Levy and Shlomo Ruschin  »View Author Affiliations


Optics Express, Vol. 16, Issue 25, pp. 20516-20521 (2008)
http://dx.doi.org/10.1364/OE.16.020516


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Abstract

This paper reports on the finding of a critical working point in the sensitivity of hetero-modal interferometric optical sensors using spectral interrogation. At this point the theoretical sensitivity approaches infinity and the practical sensitivity will depend only on the measurement accuracy and noise sources present. If the critical condition is attained at a point of minimal power transfer, a phenomenon of splitting or bifurcation of the minimum dip is expected as sensing occurs. The conditions for attainment of these critical effects are discussed.

© 2008 Optical Society of America

OCIS Codes
(280.0280) Remote sensing and sensors : Remote sensing and sensors
(280.4788) Remote sensing and sensors : Optical sensing and sensors

ToC Category:
Remote Sensing and Sensors

History
Original Manuscript: July 28, 2008
Revised Manuscript: November 3, 2008
Manuscript Accepted: November 4, 2008
Published: November 26, 2008

Citation
Ronen Levy and Shlomo Ruschin, "Critical sensitivity in hetero-modal interferometric sensor using spectral interrogation," Opt. Express 16, 20516-20521 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-25-20516


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References

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