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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 26 — Dec. 22, 2008
  • pp: 21383–21388

Accurate measurement of carrier-envelope phase drift for infrared femtosecond laser pulses

Liwei Song, Chunmei Zhang, Jianliang Wang, Yuxin Leng, and Ruxin Li  »View Author Affiliations

Optics Express, Vol. 16, Issue 26, pp. 21383-21388 (2008)

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A novel scheme to eliminate the artificial background phase jitter is proposed for measuring the carrier-envelope phase drift of tunable infrared femtosecond pulses from an OPA laser. Different from previous methods, a reference spectral interference measurement is performed, which reveals the artificial phase jitter in the measurement process, in addition to the normal f-to-2f interference measurement between the incident laser pulses and it second harmonic. By analyzing the interference fringes, the accurate CEP fluctuation of the incident pulses is obtained.

© 2008 Optical Society of America

OCIS Codes
(320.5550) Ultrafast optics : Pulses
(320.7090) Ultrafast optics : Ultrafast lasers
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7110) Ultrafast optics : Ultrafast nonlinear optics

ToC Category:
Optical Devices

Original Manuscript: October 22, 2008
Revised Manuscript: December 3, 2008
Manuscript Accepted: December 5, 2008
Published: December 10, 2008

Liwei Song, Chunmei Zhang, Jianliang Wang, Yuxin Leng, and Ruxin Li, "Accurate measurement of carrier-envelope phase drift for infrared femtosecond laser pulses," Opt. Express 16, 21383-21388 (2008)

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