OSA's Digital Library

Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 26 — Dec. 22, 2008
  • pp: 22105–22112

Strong anomalous optical dispersion of graphene: complex refractive index measured by Picometrology

Xuefeng Wang, Yong P. Chen, and David D. Nolte  »View Author Affiliations

Optics Express, Vol. 16, Issue 26, pp. 22105-22112 (2008)

View Full Text Article

Enhanced HTML    Acrobat PDF (661 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



We introduce spinning-disc Picometrology which is designed to measure complex refractive index of ultra-thin and size-limited sample deposited on a solid surface. Picometrology is applied to measure the refractive index of graphene on thermal oxide on silicon. The refractive index varies from ñg=2.4-1.0i at 532 nm to ñg=3.0-1.4i at 633 nm at room temperature. The dispersion is five times stronger than bulk graphite (2.67- 1.34i to 2.73-1.42i from 532 nm to 633 nm).

© 2008 Optical Society of America

OCIS Codes
(120.3940) Instrumentation, measurement, and metrology : Metrology
(240.0240) Optics at surfaces : Optics at surfaces
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: November 14, 2008
Revised Manuscript: December 15, 2008
Manuscript Accepted: December 15, 2008
Published: December 19, 2008

Xuefeng Wang, Yong P. Chen, and David D. Nolte, "Strong anomalous optical dispersion of graphene: complex refractive index measured by Picometrology," Opt. Express 16, 22105-22112 (2008)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. K. S. Novoselov, D. Jiang, F. Schedin, T. J. Booth, V. V. Khotkevich, S. V. Morozov, and A. K. Geim, "Two-dimensional atomic crystals," Proc. Natl. Acad. Sci. USA 102, 10451-10453 (2005). [CrossRef] [PubMed]
  2. K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, Y. Zhang, S. V. Dubonos, I. V. Grigorieva, and A. A. Firsov, "Electric field effect in atomically thin carbon films," Science 306, 666-669 (2004). [CrossRef] [PubMed]
  3. K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, M. I. Katsnelson, I. V. Grigorieva, S. V. Dubonos, and A. A. Firsov, "Two-dimensional gas of massless Dirac fermions in graphene," Nature 438, 197-200 (2005). [CrossRef] [PubMed]
  4. Y. B. Zhang, Y. W. Tan, H. L. Stormer, and P. Kim, "Experimental observation of the quantum Hall effect and Berry's phase in graphene," Nature 438, 201-204 (2005). [CrossRef] [PubMed]
  5. C. Lee, X. D. Wei, J. W. Kysar, and J. Hone, "Measurement of the elastic properties and intrinsic strength of monolayer graphene," Science 321, 385-388 (2008). [CrossRef] [PubMed]
  6. A. Calogeracos, "Relativistic quantum mechanics - Paradox in a pencil," Nature Phys. 2, 579-580 (2006). [CrossRef]
  7. F. Wang, Y. B. Zhang, C. S. Tian, C. Girit, A. Zettl, M. Crommie, and Y. R. Shen, "Gate-variable optical transitions in graphene," Science 320, 206-209 (2008). [CrossRef] [PubMed]
  8. Z. H. Ni, H. M. Wang, J. Kasim, H. M. Fan, T. Yu, Y. H. Wu, Y. P. Feng, and Z. X. Shen, "Graphene thickness determination using reflection and contrast spectroscopy," Nano Lett. 7, 2758-2763 (2007). [CrossRef] [PubMed]
  9. I. Jung, M. Pelton, R. Piner, D. A. Dikin, S. Stankovich, S. Watcharotone, M. Hausner, and R. S. Ruoff, "Simple approach for high-contrast optical imaging and characterization of graphene-based sheets," Nano Lett. 7, 3569-3575 (2007). [CrossRef]
  10. X. F. Wang, M. Zhao, and D. D. Nolte, "Common-path interferometric detection of protein monolayer on the BioCD," Appl. Opt. 46, 7836-7849 (2007). [CrossRef] [PubMed]
  11. O. S. Heavens, Optical Properties of thin solid films (1955), p. 66~80.
  12. Handbook of optical constants of solids (Academic Press, San Diego, 1991).
  13. Properties of Silicon (INSPEC, New York, 1988).
  14. B. T. Kelly, Physics of Graphite (Applied Science, London, 1981).
  15. M. S. Dresselhaus, G. Dresselhaus, and P. C. Eklund, Science of Fullerenes and Carbon Nanotubes (Academic Press, San Diego, 1996).
  16. A. B. Djurisic and E. H. Li, "Optical properties of graphite," J. Appl. Phys. 85, 7404-7410 (1999). [CrossRef]
  17. J. Li, H. T. Ng, A. Cassell, W. Fan, H. Chen, Q. Ye, J. Koehne, J. Han, and M. Meyyappan, "Carbon nanotube nanoelectrode array for ultrasensitive DNA detection," Nano Lett. 3, 597-602 (2003). [CrossRef]
  18. P. Hoyer, "Formation of a titanium dioxide nanotube array," Langmuir 12, 1411-1413 (1996). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited