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Optics Express

Optics Express

| THE INTERNATIONAL ELECTRONIC JOURNAL OF OPTICS

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 26 — Dec. 22, 2008
  • pp: 22105–22112

Optics InfoBase > Optics Express > Volume 16 > Issue 26 > Page 22105

Strong anomalous optical dispersion of graphene: complex refractive index measured by Picometrology

Xuefeng Wang, Yong P. Chen, and David D. Nolte

Optics Express, Vol. 16, Issue 26, pp. 22105-22112        doi:10.1364/OE.16.022105

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  • OCIS Codes:
  • (120.3940) Instrumentation, measurement, and metrology : Metrology
  • (240.0240) Optics at surfaces : Optics at surfaces
  • (310.6860) Thin films : Thin films, optical properties
ToC Category:
Instrumentation, Measurement, and Metrology

Citation
Xuefeng Wang, Yong P. Chen, and David D. Nolte, "Strong anomalous optical dispersion of graphene: complex refractive index measured by Picometrology," Opt. Express 16, 22105-22112 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-26-22105

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Abstract

We introduce spinning-disc Picometrology which is designed to measure complex refractive index of ultra-thin and size-limited sample deposited on a solid surface. Picometrology is applied to measure the refractive index of graphene on thermal oxide on silicon. The refractive index varies from ñg = 2.4-1.0i at 532 nm to ñg = 3.0-1.4i at 633 nm at room temperature. The dispersion is five times stronger than bulk graphite (2.67- 1.34i to 2.73-1.42i from 532 nm to 633 nm).

© 2008 Optical Society of America

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History
Original Manuscript: November 14, 2008
Manuscript Accepted: December 15, 2008
Revised Manuscript: December 15, 2008
Published: December 19, 2008

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Author Affiliations

Xuefeng Wang, Yong P. Chen, David D. Nolte

Physics Department, Purdue University

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