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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 3 — Feb. 4, 2008
  • pp: 1764–1776

Random projections based feature-specific structured imaging

Pawan K. Baheti and Mark A. Neifeld  »View Author Affiliations

Optics Express, Vol. 16, Issue 3, pp. 1764-1776 (2008)

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We present a feature-specific imaging system based on the use of structured illumination. The measurements are defined as inner products between the illumination patterns and the object reflectance function, measured on a single photodetector. The illumination patterns are defined using random binary patterns and thus do not employ prior knowledge about the object. Object estimates are generated using L1-norm minimization and gradient-projection sparse reconstruction algorithms. The experimental reconstructions show the feasibility of the proposed approach by using 42% fewer measurements than the object dimensionality.

© 2008 Optical Society of America

OCIS Codes
(110.0110) Imaging systems : Imaging systems
(150.2950) Machine vision : Illumination
(110.1758) Imaging systems : Computational imaging

ToC Category:
Imaging Systems

Original Manuscript: October 18, 2007
Revised Manuscript: December 22, 2007
Manuscript Accepted: January 21, 2008
Published: January 25, 2008

Pawan K. Baheti and Mark A. Neifeld, "Random projections based feature-specific structured imaging," Opt. Express 16, 1764-1776 (2008)

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