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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 4 — Feb. 18, 2008
  • pp: 2590–2596

Projected fringe profilometry using the area-encoded algorithm for spatially isolated and dynamic objects

Wei-Hung Su  »View Author Affiliations


Optics Express, Vol. 16, Issue 4, pp. 2590-2596 (2008)
http://dx.doi.org/10.1364/OE.16.002590


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Abstract

We present a discussion on how an area-encoded fringe pattern is applied to describe the 3D shape of objects that have spatially isolated surfaces. Phases of the fringes can be carried out without ambiguity to retrieve the 3D shape. Compared with conventional fringe projection techniques, the proposed scheme is relatively reliable and robust to identify the fringe order. Only one phase measurement is required. This makes it possible to analyze dynamic objects.

© 2008 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.4630) Instrumentation, measurement, and metrology : Optical inspection

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 2, 2008
Revised Manuscript: February 4, 2008
Manuscript Accepted: February 6, 2008
Published: February 11, 2008

Citation
Wei-Hung Su, "Projected fringe profilometry using the area-encoded algorithm for spatially isolated and dynamic objects," Opt. Express 16, 2590-2596 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-4-2590


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References

  1. M. Takeda, and K. Mutoh, "Fourier transform profilometry for the automatic measurement of 3-D object shaped," Appl. Opt. 22, 3977-3982 (1983). [CrossRef] [PubMed]
  2. V. Srinivasan, H. C. Liu, and M. Halioua, "Automated phase-measuring profilometry of 3-D diffuse objects," Appl. Opt. 23, 3105-3108 (1984). [CrossRef] [PubMed]
  3. F. Chen, G. M. Brown, and M. Song, "Overview of three-dimensional shape measurement using optical methods," Opt. Eng. 39, 10-22 (2000). [CrossRef]
  4. T. R. Judge, P. J. Bryanston-Cross, "Review of phase unwrapping techniques in fringe analysis," Opt. Lasers Eng. 21, 199-239 (1994). [CrossRef]
  5. X. Su and W. Chen, "Reliability-guided phase unwrapping algorithm: a review," Opt. Lasers Eng. 42, 245-261 (2004). [CrossRef]
  6. J. M. Huntley and H. O. Saldner, "Temporal phase-unwrapping algorithm for automated inteferogram analysis," Appl. Opt. 32, 3047-3052 (1993). [CrossRef] [PubMed]
  7. D. R. Burton and M. J. Lalor, "Multichannel Fourier fringe analysis as an aid to automatic phase unwrapping," Appl. Opt. 33, 2939-2948 (1994). [CrossRef] [PubMed]
  8. H. Zhao, W. Chen, and Y. Tan, "Phase-unwrapping algorithm for the measurement of three-dimensional object shapes," Appl. Opt. 33, 4497-4500 (1994). [CrossRef] [PubMed]
  9. W. Nadeborn, P. Andrä, and W. Osten, "A robust procedure for absolute phase measurement," Opt. Lasers Eng. 24, 245-260 (1996). [CrossRef]
  10. H. O. Saldner and J. M. Huntley, "Temporal phase-unwrapping: application to surface profiling of discontinuous objects," Appl. Opt. 36, 2770-2775 (1997). [CrossRef] [PubMed]
  11. Y. Hao, Y. Zhao, and D. Li, "Multifrequency grating projection profilometry based on the nonlinear excess fraction method," Appl. Opt. 38, 4106-4110 (1999). [CrossRef]
  12. E. B. Li, X. Peng, J. Xi, J. F. Chicharo, J. Q. Yao, and D.W. Zhang, "Multi-frequency and multiple phase-shift sinusoidal fringe projection for 3D profilometry," Opt. Express 13, 1561-1569 (2005). [CrossRef] [PubMed]
  13. M. Takeda, Q. Gu, M. Kinoshita, H. Takai, and Y. Takahashi, "Frequency-multiplex Fourier-transform profilomery: a single-shot three-dimensional shape measurement of objects with large height discontinuities and/or surface isolations," Appl. Opt. 36, 5347-5354 (1997). [CrossRef] [PubMed]
  14. W. H. Su, and H. Liu, "Calibration-based two frequency projected fringe profilometry: a robust, accurate, and single-shot meaurement for objects with large depth discontinuities," Opt. Express 14, 9178-9187 (2006). [CrossRef] [PubMed]
  15. P. Vuylsteke and A. Oosterkinck, "Range image acquisition with a single binary-encoded light pattern," IEEE Trans. Pattern Anal. Mach. Intell. 12, 148-164 (1990) [CrossRef]
  16. W. Liu, Z. Wang, G. Mu, and Z. Fang, "Color-coded projection grating method for shape measurement with a single exposure," Appl. Opt. 39, 3504-3508 (2000). [CrossRef]
  17. S. Y. Chen and Y. F. Li, "Self-recalibration of a colour-encoded light system for automated three-dimensional measurements" Meas. Sci. Technol. 14, 33-40 (2003). [CrossRef]
  18. W. H. Su, "Color-encoded fringe projection for 3D shape measurements," Opt. Express 15, 13167-13181 (2007). [CrossRef] [PubMed]
  19. W. S. Zhou and X. Y. Su, "A direct mapping algorithm for phase measuring profilometry," J. Mod. Opt. 41, 89-94 (1994). [CrossRef]
  20. Q. Hu, P. S. Huang, Q. Fu, F. P. Chiang, "Calibration of a three-dimensional shape measurement system," Opt. Eng. 42, 487-493 (2003). [CrossRef]
  21. H. Liu, W. H. Su, K. R., and S. Yin, "Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement," Opt. Commun. 216, 65-80 (2003). [CrossRef]
  22. B. A. Rajoub, M. J. Lalor, D. R. Burton, and S. A. Karout, "A new model for meaureing object shape using non-collimated frnge-pattern projections," J. Opt. A: Pure Appl. Opt. 9, S66-S75 (2007). [CrossRef]

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