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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 5 — Mar. 3, 2008
  • pp: 2928–2932

Defocus measurement for random self-affine fractal surfaces

Jun Wang, Wei Zhou, Lennie E. N. Lim, and Anand K. Asundi  »View Author Affiliations


Optics Express, Vol. 16, Issue 5, pp. 2928-2932 (2008)
http://dx.doi.org/10.1364/OE.16.002928


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Abstract

We studied correlation between fractal dimensions and image contrast for metallic surfaces. The study has led to an interesting finding that the maximum fractal dimension of the object surface under imaging gives the best focal plane. The significant finding can be made use of to estimate the best focal plane or measure the focus error with high sensitivity of a few microns, which are well within depth of field of the microscopic imaging system.

© 2008 Optical Society of America

OCIS Codes
(080.1010) Geometric optics : Aberrations (global)
(110.0180) Imaging systems : Microscopy
(110.2960) Imaging systems : Image analysis

ToC Category:
Imaging Systems

History
Original Manuscript: January 4, 2008
Revised Manuscript: February 8, 2008
Manuscript Accepted: February 14, 2008
Published: February 19, 2008

Virtual Issues
Vol. 3, Iss. 4 Virtual Journal for Biomedical Optics

Citation
Jun Wang, Wei Zhou, Lennie E. Lim, and Anand K. Asundi, "Defocus measurement for random self-affine fractal surfaces," Opt. Express 16, 2928-2932 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-5-2928


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References

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  13. V. Krishnakumar and A. K. Asundi, "Defocus measurement using spackle correlation," J. Mod. Opt. 48, 935-940 (2001).

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