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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 5 — Mar. 3, 2008
  • pp: 3342–3348

Quantitative phase measurement in coherent diffraction imaging

J. N. Clark, G. J. Williams, H. M. Quiney, L. Whitehead, M. D. de Jonge, E. Hanssen, M. Altissimo, K. A. Nugent, and A. G. Peele  »View Author Affiliations


Optics Express, Vol. 16, Issue 5, pp. 3342-3348 (2008)
http://dx.doi.org/10.1364/OE.16.003342


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Abstract

We demonstrate high spatial resolution phase retrieval of a non-periodic gold nano-structure using the method of Fresnel coherent diffractive imaging. The result is quantitative to better than 10% and does not rely on any a priori knowledge of the sample.

© 2008 Optical Society of America

OCIS Codes
(340.7440) X-ray optics : X-ray imaging
(340.7460) X-ray optics : X-ray microscopy
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)

ToC Category:
X-ray Optics

History
Original Manuscript: January 17, 2008
Revised Manuscript: February 22, 2008
Manuscript Accepted: February 25, 2008
Published: February 27, 2008

Citation
J. N. Clark, G. J. Williams, H. M. Quiney, L. Whitehead, M. D. de Jonge, E. Hanssen, M. Altissimo, K. A. Nugent, and A. G. Peele, "Quantitative phase measurement in coherent diffraction imaging," Opt. Express 16, 3342-3348 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-5-3342


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References

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