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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 5 — Mar. 3, 2008
  • pp: 3430–3438

Spectroscopic THz near-field microscope

H.-G. von Ribbeck, M. Brehm, D.W. van der Weide, S. Winnerl, O. Drachenko, M. Helm, and F. Keilmann  »View Author Affiliations

Optics Express, Vol. 16, Issue 5, pp. 3430-3438 (2008)

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We demonstrate a scattering-type scanning near-field optical microscope (s-SNOM) with broadband THz illumination. A cantilevered W tip is used in tapping AFM mode. The direct scattering spectrum is obtained and optimized by asynchronous optical sampling (ASOPS), while near-field scattering is observed by using a space-domain delay stage and harmonic demodulation of the detector signal. True near-field interaction is determined from the approach behavior of the tip to Au samples. Scattering spectra of differently doped Si are presented.

© 2008 Optical Society of America

OCIS Codes
(160.6000) Materials : Semiconductor materials
(180.4243) Microscopy : Near-field microscopy
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:

Original Manuscript: January 2, 2008
Revised Manuscript: February 15, 2008
Manuscript Accepted: February 17, 2008
Published: February 28, 2008

Virtual Issues
Vol. 3, Iss. 4 Virtual Journal for Biomedical Optics

H.-G. von Ribbeck, M. Brehm, D. W. van der Weide, S. Winnerl, O. Drachenko, M. Helm, and F. Keilmann, "Spectroscopic THz near-field microscope," Opt. Express 16, 3430-3438 (2008)

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