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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 6 — Mar. 17, 2008
  • pp: 4069–4077

Projected fringe profilometry with multiple measurements to form an entire shape

Wei-Hung Su, Cho-Yo Kuo, Chun-Chieh Wang, and Chung-Fan Tu  »View Author Affiliations


Optics Express, Vol. 16, Issue 6, pp. 4069-4077 (2008)
http://dx.doi.org/10.1364/OE.16.004069


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Abstract

A 3D sensing method to retrieve an entire shape from many segmented profiles is described. Image registration is not required in this method. Advantages of this method also include (1) very high integration accuracy, (2) improved robustness, (3) reduced computational time, (4) very low computation cost for the data fusion, and (5) capability of compensating distortions of the optical system at every pixel location.

© 2008 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.4630) Instrumentation, measurement, and metrology : Optical inspection

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 29, 2008
Revised Manuscript: March 7, 2008
Manuscript Accepted: March 7, 2008
Published: March 11, 2008

Citation
Wei-Hung Su, Cho-Yo Kuo, Chun-Chieh Wang, and Chung-Fan Tu, "Projected fringe profilometry with multiple measurements to form an entire shape," Opt. Express 16, 4069-4077 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-6-4069


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References

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