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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 6 — Mar. 17, 2008
  • pp: 4154–4162

Resolution scaling in STED microscopy

Benjamin Harke, Jan Keller, Chaitanya K. Ullal, Volker Westphal, Andreas Schönle, and Stefan W. Hell  »View Author Affiliations

Optics Express, Vol. 16, Issue 6, pp. 4154-4162 (2008)

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We undertake a comprehensive study of the inverse square root dependence of spatial resolution on the saturation factor in stimulated emission depletion (STED) microscopy and generalize it to account for various focal depletion patterns. We used an experimental platform featuring a high quality depletion pattern which results in operation close to the optimal optical performance. Its superior image brightness and uniform effective resolution <25 nm are evidenced by imaging both isolated and self-organized convectively assembled fluorescent beads. For relevant saturation values, the generalized square-root law is shown to predict the practical resolution with high accuracy.

© 2008 Optical Society of America

OCIS Codes
(180.2520) Microscopy : Fluorescence microscopy
(220.1230) Optical design and fabrication : Apodization
(350.5730) Other areas of optics : Resolution
(180.4315) Microscopy : Nonlinear microscopy

ToC Category:

Original Manuscript: January 31, 2008
Revised Manuscript: March 5, 2008
Manuscript Accepted: March 11, 2008
Published: March 12, 2008

Virtual Issues
Vol. 3, Iss. 4 Virtual Journal for Biomedical Optics

Benjamin Harke, Jan Keller, Chaitanya K. Ullal, Volker Westphal, Andreas Schönle, and Stefan W. Hell, "Resolution scaling in STED microscopy," Opt. Express 16, 4154-4162 (2008)

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