OSA's Digital Library

Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 7 — Mar. 31, 2008
  • pp: 4547–4558

Influence of surface reflective properties on differential interference contrast microscopy

Olivier Theodoly, Sylvain Gabriele, and Marie-Pierre Valignat  »View Author Affiliations


Optics Express, Vol. 16, Issue 7, pp. 4547-4558 (2008)
http://dx.doi.org/10.1364/OE.16.004547


View Full Text Article

Enhanced HTML    Acrobat PDF (3752 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We present a model describing the image formation in DIC (Differential Interference Contrast) mode microscopy, by including the actual refractive indexes and reflection coefficients of objects and substrates. We calculate the contrast of flat and level objects of nanometric thickness versus the bias retardation Γ and the numerical aperture NA. We show that high contrasts, of the edge and of the inner object, can be achieved in DIC mode with special anti-reflective substrates and large NA values. The calculations agree with contrast measurements on nanometric steps of silica and explain also the extreme ability to detect single molecules (stretched DNA molecules).

© 2008 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(240.0240) Optics at surfaces : Optics at surfaces
(260.0260) Physical optics : Physical optics
(310.0310) Thin films : Thin films

ToC Category:
Microscopy

History
Original Manuscript: October 26, 2007
Revised Manuscript: January 28, 2008
Manuscript Accepted: February 8, 2008
Published: March 18, 2008

Virtual Issues
Vol. 3, Iss. 4 Virtual Journal for Biomedical Optics

Citation
Olivier Theodoly, Sylvain Gabriele, and Marie-Pierre Valignat, "Influence of surface reflective properties on differential interference contrast microscopy," Opt. Express 16, 4547-4558 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-7-4547


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. S. Hénon and J. Meunier, "Microscope at Brewster angle: direct observation of first order phase transitions in monolayers," Rev. Sci. Instrum. 62, 936-939 (1991). [CrossRef]
  2. D. Ausserré and M. -P. Valignat, "Wide-field optical imaging of surface nanostructures," Nano Lett. 6, 1384-1388 (2006). [CrossRef] [PubMed]
  3. D. Ausserré and M.-P. Valignat, "Surface enhanced ellipsometric contrast (SEEC) basic theory and λ/4 multilayered solutions," Opt. Express 15, 8329 (2007). [CrossRef] [PubMed]
  4. M. Pluta, Advanced Light Microscopy, (Elsevier, Amsterdam,1989) Vol. 2, Chap. 7.
  5. D. L. Lessor, J. S. Hartman, R. L. Gordon, " Quantitative surface topography determination by Nomarski reflection microscopy. I. Theory," J. Opt. Soc. Am. 69, 357-366 (1979). [CrossRef]
  6. W. Galbraith and G. B. David, "An aid to understanding differential interference contrast microscopy: computer simulation," J. Microsc. 108, 147-176 (1976). [CrossRef]
  7. C. J. Cogswell and C. J. R. Sheppard, "Confocal differential interference contrast (DIC) microscopy: including a theoretical analysis of conventional and confocal DIC imaging," J. Microsc. 165, 81-101 (1992). [CrossRef]
  8. C. Preza and D. L. Snyder, "Theoretical development and experimental evaluation of imaging models for differential-interference-contrast microscopy," J. Opt. Soc. Am. A 16, 2185-2199 (1999). [CrossRef]
  9. G. M. Holzwarth, D. B. Hill, and E. B. McLaughlin, "Polarization-modulated differential-interference contrast microscopy with a variable retarder," Appl. Opt. 39, 6288-6294 (2000). [CrossRef]
  10. P. R. T. Munro and P. Török, "Vectorial, high numerical aperture study of Nomarski's differential interference contrast microscope," Opt. Express 13, 6833 (2005). [CrossRef] [PubMed]
  11. R. M. A Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, New York, 1977).
  12. R. Oldenbourg and G. Mei, "New polarized light microscope with precision universal compensator," J. Microsc. 180, 140-147 (1995). [CrossRef] [PubMed]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited