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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 7 — Mar. 31, 2008
  • pp: 4731–4738

THz emission Microscopy with sub-wavelength broadband source

Romain Lecaque, Samuel Grésillon, and Claude Boccara  »View Author Affiliations

Optics Express, Vol. 16, Issue 7, pp. 4731-4738 (2008)

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A versatile THz/IR near field microscope is demonstrated. Collecting the scattered light from a THz in-situ subwavelength source, this microscope provides images with resolution better than λ 10 . The physical origin of the contrast is explained by a Mie scattering diffraction model. Owing to the classical nature of this microscope working in the near field, resolution of THz/IR images is improved using deconvolution process.

© 2008 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(180.4243) Microscopy : Near-field microscopy
(110.6795) Imaging systems : Terahertz imaging

ToC Category:

Original Manuscript: August 23, 2007
Revised Manuscript: October 25, 2007
Manuscript Accepted: October 26, 2007
Published: March 24, 2008

Virtual Issues
Vol. 3, Iss. 4 Virtual Journal for Biomedical Optics

Romain Lecaque, Samuel Grésillon, and Claude Boccara, "THz emission Microscopy with sub-wavelength broadband source," Opt. Express 16, 4731-4738 (2008)

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