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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 8 — Apr. 14, 2008
  • pp: 5453–5464

Near-field imaging of Bloch surface waves on silicon nitride one-dimensional photonic crystals

Emiliano Descrovi, Tristan Sfez, Lorenzo Dominici, Wataru Nakagawa, Francesco Michelotti, Fabrizio Giorgis, and Hans-Peter Herzig  »View Author Affiliations

Optics Express, Vol. 16, Issue 8, pp. 5453-5464 (2008)

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We perform a near-field mapping of Bloch Surface Waves excited at the truncation interface of a planar silicon nitride multilayer. We directly determine the field distribution of Bloch Surface Waves along the propagation direction and normally to the surface. Furthermore, we present a direct measurement of a near-field enhancement effect under particular coupling conditions. Experimental evidence demonstrates that a ~102 near-field intensity enhancement can be realistically attained, thus confirming predictions from rigorous calculations.

© 2008 Optical Society of America

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(240.6690) Optics at surfaces : Surface waves
(350.4238) Other areas of optics : Nanophotonics and photonic crystals

ToC Category:
Optics at Surfaces

Original Manuscript: February 12, 2008
Revised Manuscript: March 28, 2008
Manuscript Accepted: March 28, 2008
Published: April 3, 2008

Virtual Issues
Vol. 3, Iss. 5 Virtual Journal for Biomedical Optics

Emiliano Descrovi, Tristan Sfez, Lorenzo Dominici, Wataru Nakagawa, Francesco Michelotti, Fabrizio Giorgis, and Hans-Peter Herzig, "Near-field imaging of Bloch surface waves on silicon nitride one-dimensional photonic crystals," Opt. Express 16, 5453-5464 (2008)

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