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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 8 — Apr. 14, 2008
  • pp: 5667–5672

Characterisation of periodically poled materials using nonlinear microscopy

John Harris, Greg Norris, and Gail McConnell  »View Author Affiliations


Optics Express, Vol. 16, Issue 8, pp. 5667-5672 (2008)
http://dx.doi.org/10.1364/OE.16.005667


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Abstract

Periodically poled crystalline materials are extremely attractive for processes such as second harmonic generation and optical parametric generation due to their very high conversion efficiency. For optimal performance, fabrication of poled regions with sub-micron tolerance is required. In this paper we introduce multi-photon laser scanning luminescence microscopy as a powerful minimally-invasive measurement technique which provides information about internal device structure with high spatial resolution that cannot be easily obtained with existing methods. A comparative study of confocal and multi-photon imaging of periodically poled crystalline materials is also performed.

© 2008 Optical Society of America

OCIS Codes
(100.6890) Image processing : Three-dimensional image processing
(190.4180) Nonlinear optics : Multiphoton processes
(180.4315) Microscopy : Nonlinear microscopy

ToC Category:
Microscopy

History
Original Manuscript: February 21, 2008
Revised Manuscript: March 29, 2008
Manuscript Accepted: March 30, 2008
Published: April 7, 2008

Citation
John Harris, Greg Norris, and Gail McConnell, "Characterisation of periodically poled materials using nonlinear microscopy," Opt. Express 16, 5667-5672 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-8-5667


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