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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 8 — Apr. 14, 2008
  • pp: 5689–5696

The variation of the enhanced photoluminescence efficiency of Y2O3:Eu3+ films with the thickness to the photonic crystal layer

Ki-Young Ko, Young Kwang Lee, Hoo Keun Park, Yoon-Chang Kim, and Young Rag Do  »View Author Affiliations


Optics Express, Vol. 16, Issue 8, pp. 5689-5696 (2008)
http://dx.doi.org/10.1364/OE.16.005689


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Abstract

This study examined the effects of the thickness of Y2O3:Eu3+ phosphor films on quartz substrates coated with two-dimensional (2D) SiO2 square-lattice nanorod photonic crystal layers (PCL) at identical heights on their extraction and absorption efficiency. The photoluminescence (PL) efficiency enhancement ratio decreased exponentially with increasing Y2O3:Eu3+ film thickness. The 2D PCL-assisted Y2O3:Eu3+ film with a thickness (t)=400 nm showed enhancement in the upward and downward PL emission by factors of 6.2 and 8.6, respectively, with respect to those of a conventional flat film. This observation was attributed to diffraction scattering of the excitation and emission light.

© 2008 Optical Society of America

OCIS Codes
(160.2540) Materials : Fluorescent and luminescent materials
(310.6860) Thin films : Thin films, optical properties
(160.5298) Materials : Photonic crystals

ToC Category:
Thin Films

History
Original Manuscript: January 24, 2008
Revised Manuscript: March 22, 2008
Manuscript Accepted: March 28, 2008
Published: April 8, 2008

Citation
Ki-Young Ko, Young Kwang Lee, Hoo Keun Park, Yoon-Chang Kim, and Young Rag Do, "The variation of the enhanced photoluminescence efficiency of Y2O3:Eu3+films with the thickness to the photonic crystal layer," Opt. Express 16, 5689-5696 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-8-5689


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References

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