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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 8 — Apr. 14, 2008
  • pp: 5849–5867

Phase-contrast imaging using a scanning-double-grating configuration

Ya. I. Nesterets and S. W. Wilkins  »View Author Affiliations


Optics Express, Vol. 16, Issue 8, pp. 5849-5867 (2008)
http://dx.doi.org/10.1364/OE.16.005849


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Abstract

A new double-grating-based phase-contrast imaging technique is described. This technique differs from the conventional double-grating imaging method by the image acquisition strategy. The novelty of the proposed method is in lateral scanning of both gratings simultaneously while an image is collected. The collected image is not contaminated by a Moiré pattern and can be recorded even by using a high-spatial-resolution integrating detector (e.g. X-ray film), thus facilitating improved resolution and/or contrast in the image. A detailed theoretical analysis of image formation in the scanning-double-grating method is carried out within the rigorous wave-optical formalism. The transfer function for the scanning-double- grating imaging system is derived. An approximate geometrical-optics solution for the image intensity distribution is derived from the exact wave-optical formula using the stationary-phase approach. Based on the present formalism, the effects of finite source size on the preferred operating conditions and of polychromaticity on the image contrast and resolution are investigated.

© 2008 Optical Society of America

OCIS Codes
(110.4850) Imaging systems : Optical transfer functions
(110.4980) Imaging systems : Partial coherence in imaging
(110.6760) Imaging systems : Talbot and self-imaging effects
(110.7440) Imaging systems : X-ray imaging

ToC Category:
Imaging Systems

History
Original Manuscript: January 24, 2008
Revised Manuscript: February 21, 2008
Manuscript Accepted: February 21, 2008
Published: April 11, 2008

Citation
Ya. I. Nesterets and S. W. Wilkins, "Phase-contrast imaging using a scanning-doublegrating configuration," Opt. Express 16, 5849-5867 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-8-5849


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