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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 8 — Apr. 14, 2008
  • pp: 5934–5941

Dependence of the distance between cut-wire-pair layers on resonance frequencies

V. D. Lam, J. B. Kim, N. T. Tung, S. J. Lee, Y. P. Lee, and J. Y. Rhee  »View Author Affiliations


Optics Express, Vol. 16, Issue 8, pp. 5934-5941 (2008)
http://dx.doi.org/10.1364/OE.16.005934


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Abstract

We studied both experimentally and theoretically the influence of the distance between adjacent cut-wire-pair layers on the magnetic and the electric resonances in the microwave-frequency regime. Besides the dependence on the separation between cut-wire pairs, along the electric-field direction, the electric resonance strongly depends on the distance between cut-wire-pair layers, while the magnetic resonance is almost unchanged. This contrast can be understood by the difference in the distribution of induced-charge density and in the direction of the induced current between the electric and magnetic resonances. A simple model is proposed to simulate our experimental results and the simulation results are in good agreement with the experiment. This result provides important information in obtaining left-handed behavior when the cut-wire pairs are combined with the continuous wire.

© 2008 Optical Society of America

OCIS Codes
(260.5740) Physical optics : Resonance
(160.1245) Materials : Artificially engineered materials
(160.3918) Materials : Metamaterials

ToC Category:
Metamaterials

History
Original Manuscript: February 20, 2008
Revised Manuscript: April 4, 2008
Manuscript Accepted: April 9, 2008
Published: April 11, 2008

Citation
V. D. Lam, J. B. Kim, N. T. Tung, S. J. Lee, Y. P. Lee, and J. Y. Rhee, "Dependence of the distance between cut-wire-pair layers on resonance frequencies," Opt. Express 16, 5934-5941 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-8-5934


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