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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 1 — Jan. 5, 2009
  • pp: 25–33

Optical arbitrary waveform characterization via dual-quadrature spectral interferometry

V.R. Supradeepa, Daniel E. Leaird, and Andrew M. Weiner  »View Author Affiliations


Optics Express, Vol. 17, Issue 1, pp. 25-33 (2009)
http://dx.doi.org/10.1364/OE.17.000025


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Abstract

We introduce the use of dual-quadrature spectral interferometry for amplitude and phase characterization of 100% duty factor optical arbitrary waveforms generated via spectral line-by-line pulse shaping. We demonstrate this technique for measurement of optical arbitrary waveforms composed of ~30 spectral lines from a 10 GHz frequency comb with 1.4 μs data acquisition time at an average power level of 10 microwatts. We then demonstrate coherent spectral phase measurements of pulses strongly dispersed by propagation over 50km of optical fiber.

© 2009 Optical Society of America

OCIS Codes
(060.2300) Fiber optics and optical communications : Fiber measurements
(120.3940) Instrumentation, measurement, and metrology : Metrology
(320.5520) Ultrafast optics : Pulse compression
(320.5540) Ultrafast optics : Pulse shaping
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Ultrafast Optics

History
Original Manuscript: November 14, 2008
Revised Manuscript: December 13, 2008
Manuscript Accepted: December 15, 2008
Published: December 22, 2008

Citation
V. R. Supradeepa, Daniel E. Leaird, and Andrew M. Weiner, "Optical arbitrary waveform characterization via dual-quadrature spectral interferometry," Opt. Express 17, 25-33 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-1-25


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References

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