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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 1 — Jan. 5, 2009
  • pp: 55–61

Measuring temporal speckle correlations at ultrafast x-ray sources

C. Gutt, L.-M. Stadler, A. Duri, T. Autenrieth, O. Leupold, Y. Chushkin, and G. Grübel  »View Author Affiliations

Optics Express, Vol. 17, Issue 1, pp. 55-61 (2009)

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We present a new method to extract the intermediate scattering function from series of coherent diffraction patterns taken with 2D detectors. Our approach is based on analyzing speckle patterns in terms of photon statistics. We show that the information obtained is equivalent to the conventional technique of calculating the intensity autocorrelation function. Our approach represents a route for correlation spectroscopy on ultrafast timescales at X-ray free-electron laser sources.

© 2009 Optical Society of America

OCIS Codes
(140.2600) Lasers and laser optics : Free-electron lasers (FELs)
(300.6480) Spectroscopy : Spectroscopy, speckle
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Ultrafast Optics

Original Manuscript: September 5, 2008
Revised Manuscript: November 14, 2008
Manuscript Accepted: November 17, 2008
Published: December 22, 2008

C. Gutt, L.-M. Stadler, A. Duri, T. Autenrieth, O. Leupold, Y. Chushkin, and G. Grübel, "Measuring temporal speckle correlations at ultrafast x-ray sources," Opt. Express 17, 55-61 (2009)

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