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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 10 — May. 11, 2009
  • pp: 7784–7789

Vapor-deposited thin films with negative real refractive index in the visible regime

Yi-Jun Jen, Akhlesh Lakhtakia, Ching-Wei Yu, and Chin-Te Lin  »View Author Affiliations

Optics Express, Vol. 17, Issue 10, pp. 7784-7789 (2009)

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A thin film comprising parallel tilted nanorods was deposited by directing silver vapor obliquely towards a plane substrate. The reflection and transmission coefficients of the thin film were measured at three wavelengths in the visible regime for normal-illumination conditions, using ellipsometry and walk-off interferometry. The thin film was found to display a negative real refractive index. Since vapor deposition is a well-established industrial technique to deposit thin films, this finding is promising for large-scale production of negatively refracting metamaterials.

© 2009 Optical Society of America

OCIS Codes
(310.1860) Thin films : Deposition and fabrication
(310.6860) Thin films : Thin films, optical properties
(160.3918) Materials : Metamaterials

ToC Category:
Thin Films

Original Manuscript: March 9, 2009
Revised Manuscript: April 17, 2009
Manuscript Accepted: April 23, 2009
Published: April 27, 2009

Yi-Jun Jen, Akhlesh Lakhtakia, Ching-Wei Yu, and Chin-Te Lin, "Vapor-deposited thin films with negative real refractive index in the visible regime," Opt. Express 17, 7784-7789 (2009)

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  1. D. R. Smith, J. B. Pendry, and M. C. K. Wiltshire, "Metamaterials and negative refractive index," Science 305, 788-792 (2004). [CrossRef] [PubMed]
  2. V. M. Shalaev, "Optical negative-index metamaterials," Nature Photon. 1, 41-48 (2007). [CrossRef]
  3. R. A. Shelby, D. R. Smith, and S. Schultz, "Experimental verification of a negative index of refraction," Science 292, 77-79 (2001). [CrossRef] [PubMed]
  4. V. M. Shalaev, W. Cai, U. K. Chettiar, H.-K. Yuan, A. K. Sarychev, V. P. Drachev, and A. V. Kildishev, "Negative index of refraction in optical metamaterials," Opt. Lett. 30,3356-3358 (2005). [CrossRef]
  5. S. Zhang, W. Fan, N. C. Panoiu, K. J. Malloy, R. M. Osgood, and S. R. J. Brueck, "Experimental demonstration of near-infrared negative-index metamaterials," Phys. Rev. Lett. 95,137404 (2005). [CrossRef] [PubMed]
  6. J. Yao, Z. Liu, Y. Liu, Y. Wang, C. Sun, G. Bartal, A. M. Stacy, and X. Zhang, "Optical negative refraction in bulk metamaterials of nanowires," Science 321, 930 (2008). [CrossRef] [PubMed]
  7. D. M. Mattox, The Foundations of Vacuum Coating Technology (Noyes Publications, Norwich, NY, USA, 2003).
  8. H. A. Macleod, Thin-Film Optical Filters (Institute of Physics, Bristol, United Kingdom, 2001), Chap. 9. [CrossRef]
  9. P. W. Baumeister, Optical Coating Technology (SPIE, Bellingham, WA, USA, 2004), Chap. 9. [CrossRef]
  10. H. van Kranenburg and C. Lodder, "Tailoring growth and local composition by oblique-incidence deposition: a review and new experimental data," Mater. Sci. Eng. R 11,295-354 (1994). [CrossRef]
  11. H. König and G. Helwig, "Über die Struktur schräg aufgedampfter Schichten und ihr Einfluß auf die Entwicklung submikroskopischer Oberflächenrauhigkeiten," Optik 6, 111-124 (1950).
  12. R. Messier, "The nano-world of thin films," J. Nanophoton. 2, 021995 (2008). [CrossRef]
  13. A. Kundt, "Ueber die electromagnetische Drehung der Polarisationsebene des Lichtes im Eisen," Ann. Phys. Chem. Lpz. 27, 191-202 (1886). [CrossRef]
  14. J. F. Nye, Physical Properties of Crystals (Clarendon Press, Oxford, United Kingdom, 1985).
  15. Y.-P. Zhao, S. B. Chaney, and Z.-Y. Zhang, "Absorbance spectra of aligned Ag nanorod arrays prepared by oblique angle deposition," J. Appl. Phys. 100, 063527 (2007). [CrossRef]
  16. A. Lakhtakia and R. Messier, Sculptured Thin Films: Nanoengineered Morphology and Optics (SPIE Press, Bellingham, WA, USA, 2004), Chaps. 2 and 7.
  17. D. R. Smith and S. Schultz, "Determination of effective permittivity and permeability of metamaterials from reflection and transmission coefficients," Phys. Rev. B 65, 195104 (2002). [CrossRef]
  18. P. Markos and C. M. Soukoulis, "Transmission properties and effective electromagnetic parameters of double negative metamaterials," Opt. Express 11, 649-661 (2003). [CrossRef] [PubMed]
  19. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (Elsevier, Amsterdam, The Netherlands, 1977).
  20. A. V. Kildishev, W. Cai, U. K. Chettiar, H.-K. Yuan, A. K. Sarychev, V. P. Drachev, and V. M. Shalaev, "Negative refractive index in optics of metal-dielectric composites," J. Opt. Soc. Am. B 23, 423-433 (2006). [CrossRef]
  21. J. B. Pendry, "Extremely low frequency plasmons in metallic mesostructures," Phys. Rev. Lett. 76, 4773-4776 (1996). [CrossRef] [PubMed]
  22. J. B. Pendry, A. J. Holden, D. J. Robbins, and W. J. Stewart, "Low frequency plasmons in thin-wire structures," J. Phys.: Condens. Matter 10, 4758-4809 (1998). [CrossRef]
  23. R. A. Depine and A. Lakhtakia, "A new condition to identify isotropic dielectric-magnetic materials displaying negative phase velocity," Microwave Opt. Technol. Lett. 41, 315-317 (2004). [CrossRef]
  24. S. A. Ramakrishna and J. B. Pendry, "Removal of absorption and increase in resolution in a near-field lens via optical gain," Phys. Rev. B 67, 201101 (2003). [CrossRef]

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