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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 11 — May. 25, 2009
  • pp: 8704–8708

Wideband antireflection coatings by combining interference multilayers with structured top layers

U. Schulz  »View Author Affiliations

Optics Express, Vol. 17, Issue 11, pp. 8704-8708 (2009)

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The residual reflectance obtained for a broad wavelength range depends mainly on the refractive index of the last layer. Using interference layer stacks composed of naturally available low- and high-index materials, the residual reflection for a broad range cannot be adjusted below a certain limit. However, nanostructured (gradient) and porous layers are effective media with a refractive index lower than that of natural materials. Results demonstrate that an interference layer stack combined with a structured layer as the last layer yields better antireflection properties owing to the low effective index of the structure.

© 2009 OSA

OCIS Codes
(220.4000) Optical design and fabrication : Microstructure fabrication
(310.1620) Thin films : Interference coatings
(310.1860) Thin films : Deposition and fabrication

ToC Category:
Thin Films

Original Manuscript: March 6, 2009
Revised Manuscript: April 30, 2009
Manuscript Accepted: May 5, 2009
Published: May 11, 2009

U. Schulz, "Wideband antireflection coatings by combining interference multilayers with structured top layers," Opt. Express 17, 8704-8708 (2009)

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