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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 11 — May. 25, 2009
  • pp: 8789–8794

Noise in phase shifting interferometry

M. Servin, J. C. Estrada, J. A. Quiroga, J. F. Mosiño, and M. Cywiak  »View Author Affiliations


Optics Express, Vol. 17, Issue 11, pp. 8789-8794 (2009)
http://dx.doi.org/10.1364/OE.17.008789


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Abstract

We present a theoretical analysis to estimate the amount of phase noise due to noisy interferograms in Phase Shifting Interferometry (PSI). We also analyze the fact that linear filtering transforms corrupting multiplicative noise in Electronic Speckle Pattern Interferometry (ESPI) into fringes corrupted by additive gaussian noise. This fact allow us to obtain a formula to estimate the standard deviation of the noisy demodulated phase as a function of the spectral response of the preprocessing spatial filtering combined with the PSI algorithm used. This phase noise power formula is the main result of this contribution.

© 2009 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: February 23, 2009
Revised Manuscript: March 12, 2009
Manuscript Accepted: March 12, 2009
Published: May 11, 2009

Citation
M. Servin, J. C. Estrada, J. A. Quiroga, J. F. Mosino, and M. Cywiak, "Noise in phase shifting interferometry," Opt. Express 17, 8789-8794 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-11-8789


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References

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